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Extract from the Register of European Patents

EP About this file: EP0957515

EP0957515 - Method for manufacturing an SOI wafer [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  08.04.2005
Database last updated on 05.10.2024
Most recent event   Tooltip08.04.2005Application deemed to be withdrawnpublished on 25.05.2005  [2005/21]
Applicant(s)For all designated states
STMicroelectronics Srl
Via C. Olivetti, 2
20041 Agrate Brianza (Milano) / IT
[N/P]
Former [1999/46]For all designated states
STMicroelectronics S.r.l.
Via C. Olivetti, 2
20041 Agrate Brianza (Milano) / IT
Inventor(s)01 / Barlocchi, Gabriele
Via Lucernate, 8
20010 Cornaredo / IT
02 / Villa, Flavio Francesco
Via P. Lambertenghi, 23
20159 Milano / IT
[1999/46]
Representative(s)Cerbaro, Elena, et al
Studio Torta S.p.A.
Via Viotti, 9
10121 Torino / IT
[N/P]
Former [1999/46]Cerbaro, Elena, Dr., et al
STUDIO TORTA S.r.l., Via Viotti, 9
10121 Torino / IT
Application number, filing date98830299.815.05.1998
[1999/46]
Filing languageIT
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP0957515
Date:17.11.1999
Language:EN
[1999/46]
Search report(s)(Supplementary) European search report - dispatched on:EP21.10.1998
ClassificationIPC:H01L21/762
[1999/46]
CPC:
H01L21/7624 (EP,US); H01L21/76224 (EP,US); H01L21/76264 (EP,US);
H01L21/7627 (EP,US); H01L21/76283 (EP,US)
Designated contracting statesDE,   FR,   GB,   IT [2000/30]
Former [1999/46]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Herstellungsverfahren für eine Silizium-auf-einem-Isolator-(SOI)Halbleiterscheibe[1999/46]
English:Method for manufacturing an SOI wafer[1999/46]
French:Procédé de fabrication pour une plaquette de silicium à silicium sur isolant (SOI)[1999/46]
Examination procedure15.05.2000Examination requested  [2000/28]
12.12.2003Despatch of a communication from the examining division (Time limit: M06)
09.06.2004Reply to a communication from the examining division
07.07.2004Despatch of a communication from the examining division (Time limit: M02)
18.09.2004Application deemed to be withdrawn, date of legal effect  [2005/21]
22.12.2004Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2005/21]
Fees paidRenewal fee
18.05.2000Renewal fee patent year 03
17.05.2001Renewal fee patent year 04
28.05.2002Renewal fee patent year 05
26.05.2003Renewal fee patent year 06
26.05.2004Renewal fee patent year 07
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Documents cited:Search[XA]EP0223694  (FAIRCHILD SEMICONDUCTOR [US]) [X] 1,6,7,9 * the whole document * [A] 3,4,8;
 [A]GB2156149  (PHILIPS ELECTRONIC ASSOCIATED) [A] 9 * page 3, column 1, line 2 - page 4, column 1, line 8; figures 2-5 * [A] ;
 [XA]EP0226091  (TEXAS INSTRUMENTS INC [US]) [X] 9 * the whole document * [A] 1-8;
 [XA]US4910165  (LEE STEVEN S [US], et al) [X] 9 * the whole document * [A] 1-8
 [A]  - E.J. ZORINSKY, D.B. SPRATT, R.L. VIRKUS, "THE "ISLANDS" METHOD - A MANUFACTURABLE POROUS SILICON SOI TECHNOLOGY", IEDM 86 -TECHNICAL DIGEST, LOS ANGELES, CA, (19861207), pages 431 - 434, XP002079454 [A] 1-5,9 * the whole document *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.