-
EP1032307
European procedure
Extract from the Register of European Patents
EP About this file: EP1032307
| EP1032307 - ANALYTIC MEASURING DEVICE WITH A PUNCTURING AID [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 07.03.2008 Database last updated on 21.03.2026 | Most recent event Tooltip | 15.02.2019 | Change - lapse in a contracting state State(s) deleted from list of lapses: ES | published on 20.03.2019 [2019/12] | Applicant(s) | For all designated states Roche Diagnostics GmbH Sandhofer Strasse 116 68305 Mannheim / DE | [2000/36] | Inventor(s) | 01 /
KINTZIG, Hans In der Muld 4 D-67311 Tiefenthal / DE | 02 /
SCHABBACH, Michael Lettengasse 4 D-69493 Hirschberg / DE | 03 /
MURAWSKI, Hans-Rüdiger Carl-Lepper-Strasse 10 D-68623 Lampertheim / DE | 04 /
OBERMEIER, Wolfgang Kepplerstrasse 19 D-69120 Heidelberg / DE | 05 /
MILTNER, Karl Ernst-Ludwig-Kirchner-Strasse 22 D-67227 Frankenthal / DE | [2000/36] | Application number, filing date | 98965713.5 | 30.11.1998 | [2000/36] | WO1998EP07706 | Priority number, date | DE19971052688 | 28.11.1997 Original published format: DE 19752688 | DE19981024036 | 29.05.1998 Original published format: DE 19824036 | [2000/36] | Filing language | DE | Procedural language | DE | Publication | Type: | A1 Application with search report | No.: | WO9927854 | Date: | 10.06.1999 | Language: | DE | [1999/23] | Type: | A1 Application with search report | No.: | EP1032307 | Date: | 06.09.2000 | Language: | DE | The application published by WIPO in one of the EPO official languages on 10.06.1999 takes the place of the publication of the European patent application. | [2000/36] | Type: | B1 Patent specification | No.: | EP1032307 | Date: | 02.05.2007 | Language: | DE | [2007/18] | Search report(s) | International search report - published on: | EP | 10.06.1999 | Classification | IPC: | A61B5/15, A61B5/00 | [2007/02] | CPC: |
A61B5/157 (EP,US);
A61B5/14532 (EP,US);
A61B5/150022 (EP,US);
A61B5/150778 (EP,US);
A61B5/15113 (EP,US);
A61B5/15117 (EP,US);
|
| Former IPC [2000/36] | A61B5/14, A61B5/00 | Designated contracting states | AT, CH, DE, ES, FR, GB, IT, LI, NL [2000/36] | Title | German: | ANALYTISCHES MESSGERÄT MIT STECHHILFE | [2000/36] | English: | ANALYTIC MEASURING DEVICE WITH A PUNCTURING AID | [2000/36] | French: | APPAREIL DE MESURE ANALYTIQUE AVEC ACCESSOIRE DE PIQUAGE | [2000/36] | Entry into regional phase | 28.06.2000 | National basic fee paid | 28.06.2000 | Designation fee(s) paid | 28.06.2000 | Examination fee paid | Examination procedure | 20.03.1999 | Request for preliminary examination filed International Preliminary Examining Authority: EP | 28.06.2000 | Examination requested [2000/36] | 12.11.2003 | Despatch of a communication from the examining division (Time limit: M06) | 17.04.2004 | Reply to a communication from the examining division | 12.05.2004 | Despatch of a communication from the examining division (Time limit: M04) | 16.07.2004 | Reply to a communication from the examining division | 04.03.2005 | Despatch of a communication from the examining division (Time limit: M04) | 18.06.2005 | Reply to a communication from the examining division | 27.10.2006 | Date of oral proceedings | 07.11.2006 | Minutes of oral proceedings despatched | 14.12.2006 | Communication of intention to grant the patent | 17.03.2007 | Fee for grant paid | 17.03.2007 | Fee for publishing/printing paid | Opposition(s) | 05.02.2008 | No opposition filed within time limit [2008/15] | Fees paid | Renewal fee | 13.11.2000 | Renewal fee patent year 03 | 14.11.2001 | Renewal fee patent year 04 | 13.11.2002 | Renewal fee patent year 05 | 12.11.2003 | Renewal fee patent year 06 | 08.11.2004 | Renewal fee patent year 07 | 07.11.2005 | Renewal fee patent year 08 | 06.11.2006 | Renewal fee patent year 09 |
| Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | NL | 02.05.2007 | [2019/12] |
| Former [2018/28] | ES | 02.05.2007 | |
| NL | 02.05.2007 | ||
| Former [2008/16] | NL | 02.05.2007 | |