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Extract from the Register of European Patents

EP About this file: EP0964425

EP0964425 - Apparatus for processing a work piece with a uniformly neutralised ion beam [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  25.03.2005
Database last updated on 01.10.2024
Most recent event   Tooltip25.03.2005Application deemed to be withdrawnpublished on 11.05.2005  [2005/19]
Applicant(s)For all designated states
Hitachi, Ltd.
6, Kanda Surugadai 4-chome
Chiyoda-ku
Tokyo 101-8010 / JP
[N/P]
Former [1999/50]For all designated states
Hitachi, Ltd.
6, Kanda Surugadai 4-chome
Chiyoda-ku, Tokyo 101-8010 / JP
Inventor(s)01 / Ogura, Satoshi
36-13-202, Kuji-cho 5-chome
Hitachi-shi, Ibaraki 319-1222 / JP
02 / Ooishi, Shotaro
24-15, Higashikanesawa-cho 2-chome
Hitachi-shi, Ibaraki 316-0014 / JP
03 / Hashimoto, Isao
15-15, Minamikoya-cho 1-chome
Hitachi-shi, Ibaraki 319-1224 / JP
04 / Ichimura, Satoshi
Jikyo-ryo A202, 12-1, Ayukawa-cho 6-chome
Hitachi-shi, Ibaraki 316-0036 / JP
[1999/50]
Representative(s)Strehl Schübel-Hopf & Partner
Maximilianstrasse 54
80538 München / DE
[1999/50]
Application number, filing date99110048.821.05.1999
[1999/50]
Priority number, dateJP1998016027109.06.1998         Original published format: JP 16027198
[1999/50]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP0964425
Date:15.12.1999
Language:EN
[1999/50]
Type: A3 Search report 
No.:EP0964425
Date:11.02.2004
[2004/07]
Search report(s)(Supplementary) European search report - dispatched on:EP05.01.2004
ClassificationIPC:H01J27/18, H01J37/08
[2004/07]
CPC:
H01J37/08 (EP,US); H01J27/18 (EP,US); H01J2237/0041 (EP,US);
H01J2237/0817 (EP,US); H01J2237/3142 (EP,US)
Former IPC [1999/50]H01J37/02
Designated contracting states(deleted) [2004/45]
Former [1999/50]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Apparat zur Bearbeitung eines Werkstücks mit einem gleichmässig neutralisierten Ionenstrahl[1999/50]
English:Apparatus for processing a work piece with a uniformly neutralised ion beam[1999/50]
French:Apparaeil pour le traitement d'une cible par un faisceau d'ions uniformement neutralisé[2000/01]
Former [1999/50]Appareil pour le traitment d'une cible par un faisceau d'ions uniformement neu tralisé
Examination procedure12.08.2004Application deemed to be withdrawn, date of legal effect  [2005/19]
07.12.2004Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time  [2005/19]
Fees paidRenewal fee
22.05.2001Renewal fee patent year 03
28.05.2002Renewal fee patent year 04
26.05.2003Renewal fee patent year 05
Penalty fee
Penalty fee Rule 85a EPC 1973
20.09.2004DE   M01   Not yet paid
20.09.2004FR   M01   Not yet paid
Penalty fee Rule 85b EPC 1973
20.09.2004M01   Not yet paid
Additional fee for renewal fee
31.05.200406   M06   Not yet paid
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[Y]EP0740327  (HITACHI LTD [JP]) [Y] 1-6,9 * the whole document * * column 4, line 42 - column 7, line 49; figures 1-3 *;
 [Y]US5032202  (TSAI CHIN-CHI [US], et al) [Y] 1-6,9 * column 3, lines 12-32; figure 1 *;
 [A]EP0443154  (HITACHI LTD [JP]) [A] 1 * figures 3,8 *;
 [A]US5518572  (KINOSHITA OSAMU [JP], et al) [A] 1 * figure 3 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.