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EP0984440

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Extract from the Register of European Patents

EP About this file: EP0984440

EP0984440 - Aberration detection device and optical information recording and reproducing apparatus [Right-click to bookmark this link]
Status	The application is deemed to be withdrawn Status updated on 26.03.2010 Database last updated on 10.05.2025
Most recent event Tooltip	26.03.2010	Application deemed to be withdrawn	published on 28.04.2010 [2010/17]
Applicant(s)	For all designated states Panasonic Corporation 1006, Oaza Kadoma Kadoma-shi Osaka 571-8501 / JP
	[N/P]
Former [2008/47]	For all designated states Panasonic Corporation 1006, Oaza Kadoma Kadoma-shi Osaka 571-8501 / JP
Former [2000/10]	For all designated states Matsushita Electric Industrial Co., Ltd. 1006-banchi, Oaza-Kadoma Kadoma-shi, Osaka-fu, 571-8501 / JP
Inventor(s)	01 / Saimi, Tetsuo 1-1-401, Takatsukacho Hirakata-shi, Osaka 573-0035 / JP
	02 / Tanaka, Shin-ichi 42-14, Yamatehigashi 1- chome Kyoutanabe-shi, Kyoto 610-0357 / JP
	[2000/10]
Representative(s)	Stippl, Hubert, et al Patentanwälte Freiligrathstrasse 7a 90482 Nürnberg / DE
	[N/P]
Former [2005/09]	Stippl, Hubert, Dipl.-Ing., et al Patentanwälte Freiligrathstrasse 7a 90482 Nürnberg / DE
Former [2000/10]	Hafner, Dieter, Dr.rer.nat., Dipl.-Phys. Dr. Hafner & Stippl, Patentanwälte, Ostendstrasse 132 90482 Nürnberg / DE
Application number, filing date	99117168.7	01.09.1999
	[2000/10]
Priority number, date	JP19980250750	04.09.1998 Original published format: JP 25075098
	JP19980264625	18.09.1998 Original published format: JP 26462598
	[2000/10]
Filing language	EN
Procedural language	EN
Publication	Type:	A2 Application without search report
	No.:	EP0984440
	Date:	08.03.2000
	Language:	EN
	[2000/10]
	Type:	A3 Search report
	No.:	EP0984440
	Date:	24.05.2000
	[2000/21]
Search report(s)	(Supplementary) European search report - dispatched on:	EP	31.03.2000
Classification	IPC:	G11B7/125, G11B7/13	[2000/10]
	CPC:	G11B7/1353 (EP,US); G11B7/131 (EP,US); G11B7/1369 (EP,US); G11B7/1378 (EP,US); G11B7/13927 (EP,US); G11B2007/0013 (EP,US)
Designated contracting states	DE, FR, GB, IT, NL [2001/06]
Former [2000/10]	AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE
Title	German:	Vorrichtung zur Aberrationsdetektion und Gerät zur Aufnahme und Wiedergabe von optischer Information	[2000/10]
	English:	Aberration detection device and optical information recording and reproducing apparatus	[2000/10]
	French:	Système de détection d'aberration et appareil d'enregistrement et de reproduction d'information optique	[2000/10]
Examination procedure	17.05.2000	Examination requested [2000/29]
	25.11.2000	Loss of particular rights, legal effect: designated state(s)
	21.03.2001	Despatch of communication of loss of particular rights: designated state(s) AT, BE, CH, CY, DK, ES, FI, GR, IE, LI, LU, MC, PT, SE
	13.01.2006	Despatch of a communication from the examining division (Time limit: M06)
	13.07.2006	Reply to a communication from the examining division
	10.10.2006	Despatch of a communication from the examining division (Time limit: M04)
	29.01.2007	Reply to a communication from the examining division
	10.05.2007	Despatch of a communication from the examining division (Time limit: M04)
	14.09.2007	Reply to a communication from the examining division
	09.11.2007	Despatch of a communication from the examining division (Time limit: M04)
	19.03.2008	Reply to a communication from the examining division
	06.05.2008	Despatch of a communication from the examining division (Time limit: M06)
	17.11.2008	Reply to a communication from the examining division
	28.01.2009	Despatch of a communication from the examining division (Time limit: M04)
	26.05.2009	Reply to a communication from the examining division
	23.06.2009	Communication of intention to grant the patent
	04.11.2009	Application deemed to be withdrawn, date of legal effect [2010/17]
	09.12.2009	Despatch of communication that the application is deemed to be withdrawn, reason: fee for grant / fee for printing not paid in time [2010/17]
Fees paid	Renewal fee
	26.09.2001	Renewal fee patent year 03
	26.09.2002	Renewal fee patent year 04
	18.09.2003	Renewal fee patent year 05
	23.09.2004	Renewal fee patent year 06
	02.09.2005	Renewal fee patent year 07
	12.09.2006	Renewal fee patent year 08
	07.09.2007	Renewal fee patent year 09
	16.09.2008	Renewal fee patent year 10
	Penalty fee
	Penalty fee Rule 85a EPC 1973
	05.01.2001	AT M01 Not yet paid
	05.01.2001	BE M01 Not yet paid
	05.01.2001	CH M01 Not yet paid
	05.01.2001	CY M01 Not yet paid
	05.01.2001	DK M01 Not yet paid
	05.01.2001	ES M01 Not yet paid
	05.01.2001	FI M01 Not yet paid
	05.01.2001	GR M01 Not yet paid
	05.01.2001	IE M01 Not yet paid
	05.01.2001	LU M01 Not yet paid
	05.01.2001	MC M01 Not yet paid
	05.01.2001	PT M01 Not yet paid
	05.01.2001	SE M01 Not yet paid
	Additional fee for renewal fee
	30.09.2009	11 M06 Not yet paid
Opt-out from the exclusive Tooltip competence of the Unified Patent Court	See the Register of the Unified Patent Court for opt-out data
	Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:	Search	[PA]JPH10289470 ;
		[A]US5120128 (ULICH BOBBY L [US], et al);
		[X]EP0517491 (IBM [US]);
		[X]EP0545713 (GEN ELECTRIC [US]);
		[X]US5416757 (LUECKE FRANK [US], et al);
		[X]EP0762403 (HITACHI LTD [JP]);
		[X]EP0765015 (HITACHI LTD [JP]);
		JPH09138343 [ ] (MARK KK);
		[X]EP0807928 (KONISHIROKU PHOTO IND [JP]);
		[A]EP0844606 (MATSUSHITA ELECTRIC IND CO LTD [JP]);
		[X]US5793735 (OONO MASAHIRO [JP]);
		[PX]US5818643 (FUJIOKA YOSHISATO [JP])
	Examination	EP0953974
	by applicant	JPH05282705
		JPH0777031
		JPH08212611
		JPH09212917
		EP0844606

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