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Extract from the Register of European Patents

EP About this file: EP0943950

EP0943950 - Confocal microscope and method for scanning thereof [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  06.08.2004
Database last updated on 13.07.2024
Most recent event   Tooltip19.09.2008Change - representativepublished on 22.10.2008  [2008/43]
Applicant(s)For all designated states
GF Messtechnik GmbH
Warthestrasse 21
14513 Teltow / DE
[1999/38]
Inventor(s)01 / Frankowski, Gottfried, Dr.
Halenseestrasse 1a
10711 Berlin / DE
02 / Heinrich, Hans-Helmut
Wuhletalstrasse 120
12687 Berlin / DE
03 / Breitkreuz, Konrad
Marinesteig 16
14129 Berlin / DE
[1999/38]
Representative(s)Hengelhaupt, Jürgen, et al
Gulde & Partner
Patent- und Rechtsanwaltskanzlei mbB
Wallstrasse 58/59
10179 Berlin / DE
[N/P]
Former [2008/43]Hengelhaupt, Jürgen, et al
Gulde Hengelhaupt Ziebig & Schneider Patentanwälte - Rechtsanwälte Wallstrasse 58/59
10179 Berlin / DE
Former [1999/38]Hengelhaupt, Jürgen, Dipl.-Ing., et al
Patentanwälte Gulde Hengelhaupt Ziebig, Lützowplatz 11-13
10785 Berlin / DE
Application number, filing date99250070.208.03.1999
[1999/38]
Priority number, dateDE199811120209.03.1998         Original published format: DE 19811202
[1999/38]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP0943950
Date:22.09.1999
Language:DE
[1999/38]
Search report(s)(Supplementary) European search report - dispatched on:EP29.07.1999
ClassificationIPC:G02B21/00
[1999/38]
CPC:
G02B21/0048 (EP); G02B21/0068 (EP)
Designated contracting statesAT,   FR,   GB,   NL [2000/22]
Former [1999/38]AT,  BE,  CH,  CY,  DE,  DK,  ES,  FI,  FR,  GB,  GR,  IE,  IT,  LI,  LU,  MC,  NL,  PT,  SE 
TitleGerman:Verfahren zum Rastern bei der konfokalen Mikroskopie und konfokales Mikroskop[1999/38]
English:Confocal microscope and method for scanning thereof[1999/38]
French:Microscope confocal à balayage et méthode de balayage de celui-ci[1999/38]
Examination procedure22.03.2000Examination requested  [2000/20]
05.08.2003Despatch of a communication from the examining division (Time limit: M07)
16.12.2003Application deemed to be withdrawn, date of legal effect  [2004/39]
21.04.2004Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2004/39]
Fees paidRenewal fee
30.03.2001Renewal fee patent year 03
20.03.2002Renewal fee patent year 04
28.03.2003Renewal fee patent year 05
Penalty fee
Additional fee for renewal fee
31.03.200406   M06   Not yet paid
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Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[X]US5587832  (KRAUSE ANDREW W) [X] 1,5 * column 5, line 57 - line 61; figures 1-3 *;
 [X]EP0485803  (ZEISS CARL FA ;ZEISS STIFTUNG (DE)) [X] 1 * abstract * * column 1, line 53 - column 2, line 26 *;
 [PXA]GB2321517  (YOKOGAWA ELECTRIC CORPORATION) [PX] 1,3,4 * the whole document * [PA] 5,8,9
 [X]  - LIANG MINHUA ET AL, "Confocal microscope system that uses a binary spatial light modulator", PROCEEDINGS OF THE 1997 CONFERENCE ON LASERS AND ELECTRO-OPTICS, CLEO;BALTIMORE, MD, USA MAY 18-23 1997, Conf Proc Laser Electr Optic Soc Annu Meet CLEO;Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-CLEO 1997 IEEE, Piscataway, NJ, USA, (1997), vol. 11, page 154, XP002108515 [X] 1,5 * the whole document *
 [PXA]  - HANLEY Q S ET AL, "OPTICAL SECTIONING FLUORESCENCE SPECTROSCOPY IN A PROGRAMMABLE ARRAY MICROSCOPE", APPLIED SPECTROSCOPY, (19980601), vol. 52, no. 6, ISSN 0003-7028, pages 783 - 789, XP000776113 [PX] 1 * figure 1 * [PA] 5

DOI:   http://dx.doi.org/10.1366/0003702981944364
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.