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Extract from the Register of European Patents

EP About this file: EP1060370

EP1060370 - METHOD AND APPARATUS FOR MEASURING SUBSTRATE TEMPERATURE [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  13.08.2004
Database last updated on 03.09.2024
Most recent event   Tooltip21.03.2008Lapse of the patent in a contracting state
New state(s): IT
published on 23.04.2008  [2008/17]
Applicant(s)For all designated states
Applied Materials, Inc.
3050 Bowers Avenue
Santa Clara, CA 95054 / US
[N/P]
Former [2000/51]For all designated states
Applied Materials, Inc.
3050 Bowers Avenue
Santa Clara, California 95054 / US
Inventor(s)01 / YAM, Mark
4977 Adair Way
San Jose, CA 95124 / US
02 / HUNTER, Aaron, M.
430 Emeline Avenue
Santa Cruz, CA 95060 / US
[2000/51]
Representative(s)Cross, Rupert Edward Blount, et al
Boult Wade Tennant
Verulam Gardens
70 Gray's Inn Road
London WC1X 8BT / GB
[N/P]
Former [2000/51]Cross, Rupert Edward Blount, et al
BOULT WADE TENNANT, Verulam Gardens 70 Gray's Inn Road
London WC1X 8BT / GB
Application number, filing date99906951.111.02.1999
[2000/51]
WO1999US03026
Priority number, dateUS1998002685520.02.1998         Original published format: US 26855
[2000/51]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO9942797
Date:26.08.1999
Language:EN
[1999/34]
Type: A1 Application with search report 
No.:EP1060370
Date:20.12.2000
Language:EN
The application published by WIPO in one of the EPO official languages on 26.08.1999 takes the place of the publication of the European patent application.
[2000/51]
Type: B1 Patent specification 
No.:EP1060370
Date:08.10.2003
Language:EN
[2003/41]
Search report(s)International search report - published on:EP26.08.1999
ClassificationIPC:G01J5/04, G01J5/00
[2000/51]
CPC:
G01J5/041 (EP,US); G01J5/0003 (EP,US)
Designated contracting statesDE,   FR,   GB,   IT,   NL [2000/51]
TitleGerman:VERFAHREN UND VORRICHTUNG ZUM MESSEN DER SUBSTRATTEMPERATUR[2000/51]
English:METHOD AND APPARATUS FOR MEASURING SUBSTRATE TEMPERATURE[2000/51]
French:PROCEDE ET APPAREIL DE MESURE DE LA TEMPERATURE D'UN SUBSTRAT[2000/51]
Entry into regional phase25.08.2000National basic fee paid 
25.08.2000Designation fee(s) paid 
25.08.2000Examination fee paid 
Examination procedure15.09.1999Request for preliminary examination filed
International Preliminary Examining Authority: EP
25.08.2000Examination requested  [2000/51]
18.01.2001Despatch of a communication from the examining division (Time limit: M06)
06.09.2001Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time
14.11.2001Reply to a communication from the examining division
07.02.2003Communication of intention to grant the patent
08.08.2003Fee for grant paid
08.08.2003Fee for publishing/printing paid
Opposition(s)09.07.2004No opposition filed within time limit [2004/40]
Request for further processing for:14.11.2001Request for further processing filed
14.11.2001Full payment received (date of receipt of payment)
Request granted
28.11.2001Decision despatched
Fees paidRenewal fee
09.02.2001Renewal fee patent year 03
01.02.2002Renewal fee patent year 04
03.02.2003Renewal fee patent year 05
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Lapses during opposition  TooltipFR08.10.2003
IT08.10.2003
GB11.02.2004
[2008/17]
Former [2006/14]FR08.10.2003
GB11.02.2004
Former [2005/01]GB11.02.2004
Cited inInternational search[A]EP0718610  (APPLIED MATERIALS INC [US]) [A] 1,23,24,30-35 * page 3, line 45 - page 4, line 5 * * page 5, line 54 - page 6, line 5 * * page 13, line 57 - page 14, line 4 * * figure 1 *;
 [A]EP0612862  (APPLIED MATERIALS INC [US]) [A] 1,23,24,30-35 * page 4, line 14 - line 20 * * page 9, line 41 - page 10, line 9 * * figure 3 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.