Extract from the Register of European Patents

EP Citations: EP1089874

Cited inSearch
Type:Non-patent literature
Publication information:[X]  - NARA A ET AL, "LOW DIELECTRIC CONSTANT INSULATOR FORMED BY DOWNSTREATM PLASMA CVD AT ROOM TEMPERATURE USING TMS/O2", JAPANESE JOURNAL OF APPLIED PHYSICS, PUBLICATION OFFICE JAPANESE JOURNAL OF APPLIED PHYSICS. TOKYO, JP, (199703), vol. 36, no. 3B, ISSN 0021-4922, pages 1477 - 1480, XP000861558 [X] 1-3,5-9 * paragraph [0003] *
DOI: http://dx.doi.org/10.1143/JJAP.36.1477
Type:Non-patent literature
Publication information:[A]  - SUGAHARA G ET AL, "LOW DIELECTRIC CONSTANT CARBON CONTAINING SIO2 FILMS DEPOSITED BY PECVD TECHNIQUE USING A NOVEL CVD PRECURSOR", DUMIC CONFERENCE PROCEEDINGS, XX, XX, (19970210), pages 19 - 25, XP000950049 [A] 1-16 * the whole document *
Cited inInternational search
Type:Non-patent literature
Publication information:[A]  - SAHLI S, ET AL., "PROPERTIES OF PLASMA-POLYSILOXANE DEPOSITED BY PECVD", MATERIALS CHEMISTRY AND PHYSICS, LAUSANNE, CH, CH, (19930101), vol. 33, doi:10.1016/0254-0584(93)90099-8, pages 106 - 109, XP002921829
DOI: http://dx.doi.org/10.1016/0254-0584(93)90099-8
Type:Non-patent literature
Publication information:[A]  - INOUE Y, TAKAI O, "Spectroscopic Studies on Preparation of Silicon Oxide Films by PECVD Using Organosilicon Compounds", HCAPLUS, (19000101), Database accession no. 1996:453637, XP002921830