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Extract from the Register of European Patents

EP About this file: EP1095282

EP1095282 - MULTI-POINT PROBE [Right-click to bookmark this link]
StatusPatent revoked
Status updated on  21.02.2014
Database last updated on 27.07.2024
Most recent event   Tooltip21.02.2014Revocation of patentpublished on 26.03.2014  [2014/13]
Applicant(s)For all designated states
Capres Aps
Copenhagen Applied Research, DTU Building 345 st
2800 Lyngby / DK
[2007/38]
Former [2001/18]For all designated states
Capres Aps
Copenhagen Applied Research, DTU Building 345 st
2800 Lyngby / DK
Inventor(s)01 / PETERSEN, Christian, Leth
Frederiksdalsvej 10 E, st. tv.
DK-2830 Virum / DK
02 / GREY, Francois
Boldhusgade 4
DK-1062 Copenhagen K / DK
03 / BoGGILD, Peter
AEgirsgade 61, 4 sal
DK-2200 Copenhagen N / DK
 [2001/18]
Representative(s)Nielsen, Henrik Sten, et al
Budde Schou A/S
Hausergade 3
1128 Copenhagen K / DK
[N/P]
Former [2008/35]Nielsen, Henrik Sten, et al
Budde Schou A/S Vester Søgade 10
1601 Copenhagen V / DK
Former [2001/18]Nielsen, Henrik Sten, et al
Budde, Schou & Ostenfeld A/S Vester Sögade 10
1601 Copenhagen V / DK
Application number, filing date99932677.008.07.1999
[2001/18]
WO1999DK00391
Priority number, dateEP1998061002308.07.1998         Original published format: EP 98610023
DK1937000089917.03.1999         Original published format: DK 37899
[2001/18]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO0003252
Date:20.01.2000
Language:EN
[2000/03]
Type: A2 Application without search report 
No.:EP1095282
Date:02.05.2001
Language:EN
The application published by WIPO in one of the EPO official languages on 20.01.2000 takes the place of the publication of the European patent application.
[2001/18]
Type: B1 Patent specification 
No.:EP1095282
Date:19.09.2007
Language:EN
[2007/38]
Search report(s)International search report - published on:EP13.04.2000
ClassificationIPC:G01R1/073
[2001/18]
CPC:
G01R1/06733 (EP,US); G01R1/07307 (EP,US); G01R27/14 (EP,US);
G01R1/06711 (EP,US); G01R1/06727 (EP); G01R1/06755 (EP,US);
G01R27/04 (EP,US); G01R31/2648 (EP,US); G01R31/2831 (EP,US) (-)
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   MC,   NL,   PT,   SE [2001/18]
TitleGerman:MEHRSPITZENFÜHLER[2001/18]
English:MULTI-POINT PROBE[2001/18]
French:SONDE A PLUSIEURS POINTS[2001/18]
Entry into regional phase08.02.2001National basic fee paid 
08.02.2001Designation fee(s) paid 
08.02.2001Examination fee paid 
Examination procedure07.02.2000Request for preliminary examination filed
International Preliminary Examining Authority: SE
08.02.2001Examination requested  [2001/18]
25.02.2002Despatch of a communication from the examining division (Time limit: M06)
09.09.2002Reply to a communication from the examining division
03.08.2004Despatch of a communication from the examining division (Time limit: M06)
20.01.2005Reply to a communication from the examining division
21.09.2006Date of oral proceedings
07.02.2007Minutes of oral proceedings despatched
26.03.2007Communication of intention to grant the patent
06.08.2007Fee for grant paid
06.08.2007Fee for publishing/printing paid
25.04.2012Observations by third parties
Divisional application(s)EP06019447.9   Application deemed to be withdrawn  : 19.10.2006
Opposition(s)Opponent(s)01  18.06.2008  22.07.2008  ADMISSIBLE
SmartTip BV
Drienerlolaan 5
7522 NB Enschede / NL
Opponent's representative
Altenburg, Bernardus Stephanus Franciscus
DOGIO Patents BV
PO Box 2350
1200 CJ Hilversum / NL
 02  19.06.2008  22.07.2008  ADMISSIBLE
Octrolix B.V.
De Veldmaat 10
7522 NM Enschede / NL
Opponent's representative
Schumann, Bernard Herman Johan
Arnold & Siedsma
Bezuidenhoutseweg 57
2594 AC The Hague / NL
 [N/P]
Former [2009/34]
Opponent(s)01  18.06.2008  22.07.2008  ADMISSIBLE
SmartTip BV
Drienerlolaan 5
7522 NB Enschede / NL
Opponent's representative
Altenburg, Bernardus Stephanus Franciscus
ALTENBURG PATENT Ravelijnstraat 125
4102 AJ Culemborg / NL
 02  19.06.2008  22.07.2008  ADMISSIBLE
Octrolix B.V.
De Veldmaat 10
7522 NM Enschede / NL
Opponent's representative
Schumann, Bernard Herman Johan
Schumann Patent Consultancy B.V., Kerkedennen 43
7621 EB Borne / NL
Former [2008/32]
Opponent(s)01  18.06.2008   
SmartTip BV
Drienerlolaan 5
7522 NB Enschede / NL
Opponent's representative
Habets, Winand
Altenburg Patent P.O. Box 82
4100 AB Culemborg / NL
 02  19.06.2008   
Octrolix B.V.
De Veldmaat 10
7522 NM Enschede / NL
Opponent's representative
Schumann, Bernard Herman Johan
Schumann Patent Consultancy B.V., Kerkedennen 43
7621 EB Borne / NL
deletedDeletion: Legal effect of rejection of opposition [ N /P ]
25.07.2008Invitation to proprietor to file observations on the notice of opposition
04.12.2008Reply of patent proprietor to notice(s) of opposition
06.05.2009Date of oral proceedings
22.06.2009Despatch of minutes of oral proceedings
22.06.2009Date of despatch of rejection of opposition
07.05.2012Legal effect of revocation of patent [ N /P ]
07.05.2012Legal effect of revocation of patent [2014/13]
27.06.2012Despatch of communication that the patent will be revoked
Appeal following opposition14.08.2009Appeal received No.  T1625/09
21.10.2009Statement of grounds filed
07.05.2012Result of appeal procedure: revocation of the patent
05.08.2009Appeal received No.  T1625/09
20.10.2009Statement of grounds filed
07.05.2012Result of appeal procedure: revocation of the patent
Petition(s) for review:07.09.2012Petition for review received
 Number:  R0016/12
 for appeal No.  T1625/09-3401
 Petitioner:  APPR
15.11.2013Decision:  Petition for review obviously unsubstantiated only.
15.11.2013Date of oral proceedings
Fees paidRenewal fee
31.07.2001Renewal fee patent year 03
31.07.2002Renewal fee patent year 04
31.07.2003Renewal fee patent year 05
02.08.2004Renewal fee patent year 06
01.08.2005Renewal fee patent year 07
31.07.2006Renewal fee patent year 08
31.07.2007Renewal fee patent year 09
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT19.09.2007
BE19.09.2007
CH19.09.2007
CY19.09.2007
DK19.09.2007
FI19.09.2007
LI19.09.2007
SE19.12.2007
GR20.12.2007
ES30.12.2007
PT19.02.2008
LU08.07.2008
MC31.07.2008
NL01.02.2012
[2014/07]
Former [2010/28]AT19.09.2007
BE19.09.2007
CH19.09.2007
CY19.09.2007
DK19.09.2007
FI19.09.2007
LI19.09.2007
SE19.12.2007
GR20.12.2007
ES30.12.2007
PT19.02.2008
LU08.07.2008
MC31.07.2008
Former [2010/06]AT19.09.2007
BE19.09.2007
CH19.09.2007
CY19.09.2007
DK19.09.2007
FI19.09.2007
LI19.09.2007
SE19.12.2007
GR20.12.2007
ES30.12.2007
PT19.02.2008
MC31.07.2008
Former [2009/18]AT19.09.2007
BE19.09.2007
CH19.09.2007
DK19.09.2007
FI19.09.2007
LI19.09.2007
SE19.12.2007
GR20.12.2007
ES30.12.2007
PT19.02.2008
MC31.07.2008
Former [2008/35]AT19.09.2007
BE19.09.2007
CH19.09.2007
DK19.09.2007
FI19.09.2007
LI19.09.2007
SE19.12.2007
GR20.12.2007
ES30.12.2007
PT19.02.2008
Former [2008/28]AT19.09.2007
BE19.09.2007
CH19.09.2007
FI19.09.2007
LI19.09.2007
SE19.12.2007
GR20.12.2007
ES30.12.2007
PT19.02.2008
Former [2008/24]AT19.09.2007
BE19.09.2007
CH19.09.2007
FI19.09.2007
LI19.09.2007
GR20.12.2007
ES30.12.2007
PT19.02.2008
Former [2008/21]AT19.09.2007
BE19.09.2007
CH19.09.2007
FI19.09.2007
LI19.09.2007
GR20.12.2007
Former [2008/18]AT19.09.2007
CH19.09.2007
FI19.09.2007
LI19.09.2007
Cited inInternational search[X]JPH07199219  ;
 [X]JPH01147374  ;
 [A]EP0466274  (IMEC INTER UNI MICRO ELECTR [BE]) [A] 1,50 * column 1, line 1 - line 27 *;
 [Y]US5171992  (CLABES JOACHIM G [US], et al) [Y] 25-49,62-64 * abstract * * column 2, line 63 - column 3, line 3 * * column 4, line 31 - line 53 * * column 6, line 22 - line 24 * * column 6, line 41 - line 60 *;
 [X]DE4301420  (SIEMENS AG [DE]) [X] 60,61 * abstract * * column 1, line 55 - column 2, line 6 * * column 2, line 33 - line 50 * * column 2, line 62 - column 3, line 3 *;
 [XD]US5347226  (BACHMANN WALTER A [US], et al) [XD] 1,50 * abstract *;
 [XY]US5475318  (MARCUS ROBERT B [US], et al) [X] 1-24,50-59 * column 1, line 5 - line 14; figures 4,5,8B * * column 3, line 6 - line 15 * * column 6, line 25 - line 67 * [Y] 25-49,62-64;
 [A]JPH0815318  (YAMAICHI ELECTRIC CO LTD, et al) [A] 8-10 * figure 9 *;
 [X]US5557214  (BARNETT C KENNETH [US]) [X] 1,50 * abstract *;
 [A]US5613861  (SMITH DONALD L [US], et al) [A] 25,60* abstract *;
 [X]DE19648475  (ADVANTEST CORP [JP]) [X] 1,50 * abstract *;
 [XP]EP0899538  (IMEC VZW [BE]) [XP] 1,25,50,60 * abstract * * column 1, line 14 - line 31 * * column 7, line 40 - column 8, line 30 * * column 10, line 37 - line 48 * * column 12, line 20 - column 13, line 6 *;
 [X]  - PATENT ABSTRACTS OF JAPAN, (19951226), vol. 095, no. 011, & JP07199219 A 19950804 (MITSUI ENG & SHIPBUILD CO LTD) [X] 1,50 * abstract *
 [X]  - LEE C ET AL, "HIGH-DENSITY SILICON MICROPROBE ARRAYS FOR LCD PIXEL INSPECTION", PROCEEDINGS OF THE 9TH. ANNUAL INTERNATIONAL WORKSHOP ON MICRO ELEC MECHANICAL SYSTEMS, INVESTIGATION OF MICRO STRUCTURES, SENSORS, ACTUATORS, MACHINES AND SYSTEMS. SAN DIEGO, FEB. 11 - 15, 1996, INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, (19960211), no. WORKSHOP 9, pages 429 - 434, XP000689309 [X] 1,50 * abstract *
 [X]  - SOONIL HONG ET AL, "DESIGN AND FABRICATION OF A MONOLITHIC HIGH-DENSITY PROBE CARD FOR HIGH-FREQUENCY ON-WAFER TESTING", PROCEEDINGS OF THE INTERNATIONAL ELECTRON DEVICES MEETING, WASHINGTON, DEC. 3 - 6, 1989, INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, (19891203), pages 289 - 292, XP000448223 [X] 1,50 * abstract * * page 289, column R, paragraph 1 *
 [X]  - PATENT ABSTRACTS OF JAPAN, (19890908), vol. 013, no. 406, Database accession no. (P - 930), & JP01147374 A 19890609 (HITACHI LTD) [X] 1,50 * abstract *
 [AD]  - FUJII T ET AL, "MICROPATTERN MEASUREMENT WITH AN ATOMIC FORCE MICROSCOPE", JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY: PART B, (19910301), vol. 9, no. 2 PART 02, ISSN 0734-211X, pages 666 - 669, XP000222891 [AD] 1-24 * page 667, column R, paragraph 2 - page 668, column L, paragraph 2 *

DOI:   http://dx.doi.org/10.1116/1.585483
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.