EP1033624 - RADIATION-SENSITIVE COMPOSITION OF CHEMICAL AMPLIFICATION TYPE [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 21.12.2012 Database last updated on 02.11.2024 | Most recent event Tooltip | 21.12.2012 | Application deemed to be withdrawn | published on 23.01.2013 [2013/04] | Applicant(s) | For all designated states AZ Electronic Materials USA Corp. 70 Meister Avenue Somerville, NJ 08876 / US | [2005/06] |
Former [2001/29] | For all designated states Clariant Finance (BVI) Limited Citco Building, Wickhams Cay Road Town, Tortola / VG | ||
Former [2000/36] | For all designated states Clariant International Ltd. Rothausstrasse 61 4132 Muttenz 1 / CH | Inventor(s) | 01 /
PAWLOWSKI, Georg, Clariant (Japan) K.K. 3810, Chihama, Daito-cho Ogasa-gun, Sizuoka 437-1496 / JP | 02 /
OKAZAKI, Hiroshi, Clariant (Japan) K.K. 3810, Chihama, Daito-cho Ogasa-gun, Sizuoka 437-1496 / JP | 03 /
KINOSHITA, Yoshiaki, Clariant (Japan) K.K. 3810, Chihama, Daito-cho Ogasa-gun, Sizuoka 437-1496 / JP | 04 /
TSUGAMA, Naoko, Clariant (Japan) K.K. 3810, Chihama, Daito-cho Ogasa-gun, Sizuoka 437-1496 / JP | 05 /
HISHIDA, Aritaka, Clariant (Japan) K.K. 3810, Chihama, Daito-cho Ogasa-gun, Sizuoka 437-1496 / JP | 06 /
MA, Xiao-ming, Clariant (Japan) K.K. 3810, Chihama, Daito-cho Ogasa-gun, Sizuoka 437-1496 / JP | 07 /
YAMAGUCHI, Yuko 203, Berunina-2bankan, 335-1, Kasakubo Isehara-shi, Kanagawa 259-1137 / JP | [2000/36] | Representative(s) | Isenbruck, Günter, et al Patentanwälte Isenbruck Bösl Hörschler PartG mbB Eastsite One Seckenheimer Landstrasse 4 68163 Mannheim / DE | [N/P] |
Former [2008/38] | Isenbruck, Günter, et al Isenbruck, Bösl, Hörschler, Wichmann, Huhn Patentanwälte Theodor-Heuss-Anlage 12 68165 Mannheim / DE | ||
Former [2005/06] | Isenbruck, Günter, et al Isenbruck, Bösl, Hörschler, Wichmann, Huhn, Patentanwälte Theodor-Heuss-Anlage 12 68165 Mannheim / DE | ||
Former [2000/36] | Hütter, Klaus, Dr., et al Clariant GmbH Patente, Marken, Lizenzen Am Unisys-Park 1 65843 Sulzbach / DE | Application number, filing date | 99935116.6 | 09.08.1999 | [2000/36] | WO1999JP04304 | Priority number, date | JP19980225029 | 07.08.1998 Original published format: JP 22502998 | JP19990087036 | 29.03.1999 Original published format: JP 8703699 | [2000/36] | Filing language | JA | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO0008525 | Date: | 17.02.2000 | Language: | EN | [2000/07] | Type: | A1 Application with search report | No.: | EP1033624 | Date: | 06.09.2000 | Language: | EN | The application published by WIPO in one of the EPO official languages on 17.02.2000 takes the place of the publication of the European patent application. | [2000/36] | Search report(s) | International search report - published on: | JP | 17.02.2000 | (Supplementary) European search report - dispatched on: | EP | 18.07.2003 | Classification | IPC: | G03F7/004, G03F7/039, G03F7/038, C07C381/12, C07C309/06 | [2000/36] | CPC: |
C07C309/06 (EP,US);
G03F7/0392 (EP,KR,US);
G03F7/004 (US);
C07C381/12 (EP,US);
C07D401/04 (KR);
C07D401/12 (KR);
C07D401/14 (KR);
C07D417/14 (KR);
C07D487/04 (KR);
G03F7/0045 (EP,KR,US);
G03F7/038 (EP,US);
G03F7/0382 (EP,US);
| Designated contracting states | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE [2000/36] | Title | German: | CHEMISCH VERSTÄRKTE RESIST-ZUSAMMENSETZUNG | [2000/36] | English: | RADIATION-SENSITIVE COMPOSITION OF CHEMICAL AMPLIFICATION TYPE | [2000/36] | French: | COMPOSITION RADIOSENSIBLE DU TYPE A AMPLIFICATION CHIMIQUE | [2000/36] | Entry into regional phase | 23.02.2000 | Translation filed | 08.05.2000 | National basic fee paid | 08.05.2000 | Search fee paid | 17.08.2000 | Designation fee(s) paid | 17.08.2000 | Examination fee paid | Examination procedure | 17.08.2000 | Examination requested [2000/42] | 13.10.2003 | Amendment by applicant (claims and/or description) | 03.12.2009 | Despatch of a communication from the examining division (Time limit: M06) | 10.05.2010 | Reply to a communication from the examining division | 07.03.2011 | Despatch of a communication from the examining division (Time limit: M06) | 04.01.2012 | Reply to a communication from the examining division | 19.03.2012 | Despatch of a communication from the examining division (Time limit: M04) | 31.07.2012 | Application deemed to be withdrawn, date of legal effect [2013/04] | 04.09.2012 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2013/04] | Divisional application(s) | EP11193249.7 Application deemed to be withdrawn : 14.01.2012 | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 03.12.2009 | Request for further processing for: | The application is deemed to be withdrawn due to failure to reply to the examination report | 04.01.2012 | Request for further processing filed | 04.01.2012 | Full payment received (date of receipt of payment) Request granted | 23.01.2012 | Decision despatched | Fees paid | Renewal fee | 31.08.2001 | Renewal fee patent year 03 | 02.09.2002 | Renewal fee patent year 04 | 01.09.2003 | Renewal fee patent year 05 | 31.08.2004 | Renewal fee patent year 06 | 31.08.2005 | Renewal fee patent year 07 | 31.08.2006 | Renewal fee patent year 08 | 31.08.2007 | Renewal fee patent year 09 | 29.08.2008 | Renewal fee patent year 10 | 31.08.2009 | Renewal fee patent year 11 | 31.08.2010 | Renewal fee patent year 12 | 25.08.2011 | Renewal fee patent year 13 | 30.08.2012 | Renewal fee patent year 14 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | JPH0912537 [ ] (SHINETSU CHEMICAL CO); | [X]US5773191 (PADMANABAN MUNIRATHNA [JP], et al) [X] 1-14,16-23 * examples 1,12; claims 1,2 * * column 3, line 7 - column 5, line 34 *; | [X]EP0819981 (JAPAN SYNTHETIC RUBBER CO LTD [JP]) [X] 1-23 * claims 1,4,9 * * page 28, line 33 - page 34, line 30 * * page 35, line 12 - line 17 *; | JPH1097075 [ ] (FUJI PHOTO FILM CO LTD) [ ] * page 18 - page 21 *; | [PX]EP0898201 (JSR CORP [JP]) [PX] 1-23,25 * abstract * * page 7, line 34 - page 11, line 20 * * page 17, line 46 - page 18, line 3 *; | [X]JPH107650 ; | US5824824 [ ] (OSAWA YOICHI [JP], et al) [ ] * examples E1-5; claims 1-9; table 1 *; | [X]DD295421 (UNIV BERLIN HUMBOLDT [DD]) [X] 1,5-9 * example 1; claims 1,2 * * page 3, paragraph 6 *; | [DX]US5731364 (SINTA ROGER F [US], et al) [DX] 1,5-9,12-14,16-20 * column A; examples 1C,2 * * column 8, line 55 - column 10, line 15 *; | [DX]EP0794458 (LUCENT TECHNOLOGIES INC [US]) [DX] 25 * abstract *; | [A]EP0679635 (HOECHST AG [DE]) [A] 1 * example 20; claims 1,4,11 * | [X] - CA, CHEMICAL ABSTRACTS SERVICE, COLUMBUS, OHIO, US, Database accession no. 126:179054/DN, HCAPLUS, URL: STN, XP002232138 [X] 1-12,21-23,26 * abstract * * RN 186889-41-8, -43-0, -45-2, -47-4, -49-6, -52-1, -54-3, -57-6, -60-1 * | [X] - CA, CHEMICAL ABSTRACTS SERVICE, COLUMBUS, OHIO, US, Database accession no. 128:328771/DN, HCAPLUS, URL: STN, XP002232139 [X] 1,5-9 * abstract * * RN 206861-54-3 * | [X] - "HIGHLY SOLUBLE, THERMALLY STABLE PHOTOACID INITIATORS", RESEARCH DISCLOSURE, KENNETH MASON PUBLICATIONS, HAMPSHIRE, GB, (19920510), no. 337, ISSN 0374-4353, page 332,AN33701, XP000309797 [X] 1-5 * the whole document * | [X] - DATABASE WPI, 1, Derwent World Patents Index, vol. 1998, no. 12, Database accession no. 1998-126138, XP002232140 & JPH107650 A 19980113 (NIPPON TELEGRAPH & TELEPHONE CORP) [X] 1,5-13 * abstract * | [PX] - HOULIHAN F M ET AL, "A STUDY OF RESIST OUTGASSING AS A FUNCTION OF DIFFERING PHOTOADDITIVES", PROCEEDINGS OF THE SPIE, SPIE, BELLINGHAM, VA, US, (19990315), vol. 3678, no. PART 1/2, pages 264 - 274, XP000973240 [PX] 25,26,28 * page 264 - page 265 * * page 271 - page 272 * DOI: http://dx.doi.org/10.1117/12.350209 | [X] - KRAGLER K ET AL, "LOW-VOLTAGE ELECTRON-BEAM LITHOGRAPHY WITH SCANNING TUNNELING MICROSCOPY IN AIR: A NEW METHOD FOR PRODUCING STRUCTURES WITH HIGH ASPECT RATIOS", JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY: PART B, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, (19960301), vol. 14, no. 2, ISSN 0734-211X, pages 1327 - 1330, XP000621734 [X] 25 * page 1327 - page 1328 * DOI: http://dx.doi.org/10.1116/1.589090 | [X] - SUZUKI Y ET AL, "PHOTOACID GENERATORS IN CHEMICALLY AMPLIFIED RESISTS", PROCEEDINGS OF THE SPIE, SPIE, BELLINGHAM, VA, US, (1998), vol. 3333, no. PART 1/2, pages 735 - 746, XP008011964 [X] 1-9,25 * page 735 - page 738; table 2 * DOI: http://dx.doi.org/10.1117/12.312350 | International search | [Y]JPH1048814 (JAPAN SYNTHETIC RUBBER CO LTD); | [Y]JPH08248626 (SHINETSU CHEMICAL CO, et al); | [Y]JPH0827094 (JAPAN SYNTHETIC RUBBER CO LTD); | [Y]JPH05222257 (CIBA GEIGY AG); | [XP]JPH1130865 (JSR CORP) |