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Extract from the Register of European Patents

EP About this file: EP1084399

EP1084399 - METHOD FOR DETERMINING NOX CONCENTRATION [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  11.10.2002
Database last updated on 05.10.2024
Most recent event   Tooltip11.10.2002No opposition filed within time limitpublished on 27.11.2002  [2002/48]
Applicant(s)For all designated states
SIEMENS AKTIENGESELLSCHAFT
Werner-von-Siemens-Str. 1
DE-80333 München / DE
[N/P]
Former [2001/12]For all designated states
SIEMENS AKTIENGESELLSCHAFT
Wittelsbacherplatz 2
80333 München / DE
Inventor(s)01 / ZHANG, Hong
Brandlbergerstrasse 138
D-93057 Regensburg / DE
02 / RÖSSLER, Jürgen
Schwabenstrasse 10
D-93053 Regensburg / DE
 [2001/12]
Application number, filing date99948567.509.04.1999
[2001/12]
WO1999DE01090
Priority number, dateDE199811958130.04.1998         Original published format: DE 19819581
[2001/12]
Filing languageDE
Procedural languageDE
PublicationType: A2 Application without search report
No.:WO9957556
Date:11.11.1999
Language:DE
[1999/45]
Type: A2 Application without search report 
No.:EP1084399
Date:21.03.2001
Language:DE
The application published by WIPO in one of the EPO official languages on 11.11.1999 takes the place of the publication of the European patent application.
[2001/12]
Type: B1 Patent specification 
No.:EP1084399
Date:05.12.2001
Language:DE
[2001/49]
Search report(s)International search report - published on:EP16.12.1999
ClassificationIPC:G01N27/419
[2001/12]
CPC:
G01N27/417 (EP,US)
Designated contracting statesDE,   FR,   GB [2001/12]
TitleGerman:VERFAHREN ZUR BESTIMMUNG DER NOX-KONZENTRATION[2001/12]
English:METHOD FOR DETERMINING NOX CONCENTRATION[2001/12]
French:PROCEDE POUR LA DETERMINATION DE LA CONCENTRATION EN NOX[2001/12]
Entry into regional phase28.06.2000National basic fee paid 
28.06.2000Designation fee(s) paid 
28.06.2000Examination fee paid 
Examination procedure26.11.1999Request for preliminary examination filed
International Preliminary Examining Authority: EP
28.06.2000Examination requested  [2001/12]
21.05.2001Despatch of communication of intention to grant (Approval: Yes)
08.06.2001Communication of intention to grant the patent
23.08.2001Fee for grant paid
23.08.2001Fee for publishing/printing paid
Opposition(s)06.09.2002No opposition filed within time limit [2002/48]
Fees paidRenewal fee
19.04.2001Renewal fee patent year 03
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Cited inInternational search[A]EP0816836  (NGK INSULATORS LTD [JP]) [A] 1 * column 19, line 54 - column 20, line 12; figure 5 * * column 23, line 9 - line 43; figure 11 *;
 [A]EP0769694  (NGK INSULATORS LTD [JP]) [A] 1 * column 21, line 47 - column 22, line 54; figures 4A,4B *;
 [A]EP0831322  (NGK INSULATORS LTD [JP]) [A] 1 * figure 10 *
 [X]  - KATO NOBUHIDE ET AL, "Thick film ZrO2 NOx sensor for the measurement of low NOx concentration", PROCEEDINGS OF THE 1998 SAE INTERNATIONAL CONGRESS & EXPOSITION;DETROIT, MI, USA FEB 23-26 1998, SAE Spec Publ;SAE Special Publications; Electronic Engine Controls 1998: Sensors, Actuators, and Development Tools Feb 1998 SAE, Warrendale, PA, USA, (199802), vol. 1356, pages 69 - 77, XP002118676 [X] 1 * page 74 - page 76; figure 10 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.