-
EP1474782
European procedure
Extract from the Register of European Patents
EP About this file: EP1474782
| EP1474782 - METHOD AND APPARATUS FOR DETERMINING SYMMETRY IN 2D AND 3D IMAGES [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 13.03.2009 Database last updated on 20.05.2024 | Most recent event Tooltip | 27.11.2009 | Lapse of the patent in a contracting state | published on 30.12.2009 [2009/53] | Applicant(s) | For all designated states Agency for Science, Technology and Research 20 Biopolis Way, No. 07-01, Centros Singapore 138668 / SG | [N/P] |
| Former [2008/18] | For all designated states Agency for Science, Technology and Research (A*STAR) 20 Biopolis Way, No. 07-01, Centros Singapore 138668 / SG | ||
| Former [2004/46] | For all designated states Kent Ridge Digital Labs 21 Heng Mui Keng Terrace Singapore 119613 / SG | Inventor(s) | 01 /
HU, Quingmao 42 Toh Tuck Road, 02-05, Good Luck Garden Singapore 596718 / SG | 02 /
NOWINSKI, Wieslaw L. 111 Clementi Road, 10-06 Nus Kent Vale, Blk. C Singapore 129792 / SG | [2004/46] | Representative(s) | Campbell, Arlene, et al Murgitroyd & Company Scotland House 165-169 Scotland Street Glasgow G5 8PL / GB | [N/P] |
| Former [2007/25] | Campbell, Arlene, et al Murgitroyd & Company 165-169 Scotland Street Glasgow G5 8P1 L / GB | ||
| Former [2004/46] | Fitzpatrick, Alan James Fitzpatricks, 4 West Regent Street Glasgow G2 1RS, Scotland / GB | Application number, filing date | 02703031.1 | 18.01.2002 | [2004/46] | WO2002SG00006 | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO03060827 | Date: | 24.07.2003 | Language: | EN | [2003/30] | Type: | A1 Application with search report | No.: | EP1474782 | Date: | 10.11.2004 | Language: | EN | The application published by WIPO in one of the EPO official languages on 24.07.2003 takes the place of the publication of the European patent application. | [2004/46] | Type: | B1 Patent specification | No.: | EP1474782 | Date: | 07.05.2008 | Language: | EN | [2008/19] | Search report(s) | International search report - published on: | AT | 24.07.2003 | Classification | IPC: | G06T7/60 | [2007/33] | CPC: |
G06T7/68 (EP,US);
G06T2207/30016 (EP,US)
|
| Former IPC [2004/46] | G06T7/60, G06T7/40 | Designated contracting states | DE, GB, NL [2008/19] |
| Former [2004/46] | AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LI, LU, MC, NL, PT, SE, TR | Extension states | AL | Not yet paid | LT | Not yet paid | LV | Not yet paid | MK | Not yet paid | RO | Not yet paid | SI | Not yet paid | Title | German: | VERFAHREN UND VORRICHTUNG ZUR BESTIMMUNG VON SYMMETRIE IN 2D- UND 3D-BILDERN | [2004/46] | English: | METHOD AND APPARATUS FOR DETERMINING SYMMETRY IN 2D AND 3D IMAGES | [2004/46] | French: | PROCEDE ET DISPOSITIF PERMETTANT DE DETECTER UNE SYMETRIE DANS DES IMAGES EN 2D ET EN 3D | [2004/46] | Entry into regional phase | 18.11.2003 | National basic fee paid | 18.11.2003 | Designation fee(s) paid | 18.11.2003 | Examination fee paid | Examination procedure | 18.08.2003 | Request for preliminary examination filed International Preliminary Examining Authority: AT | 18.11.2003 | Examination requested [2004/46] | 08.02.2006 | Despatch of a communication from the examining division (Time limit: M04) | 13.06.2006 | Reply to a communication from the examining division | 01.12.2006 | Despatch of a communication from the examining division (Time limit: M06) | 31.05.2007 | Reply to a communication from the examining division | 16.08.2007 | Communication of intention to grant the patent | 14.12.2007 | Fee for grant paid | 14.12.2007 | Fee for publishing/printing paid | Opposition(s) | 10.02.2009 | No opposition filed within time limit [2009/16] | Fees paid | Renewal fee | 05.01.2004 | Renewal fee patent year 03 | 17.01.2005 | Renewal fee patent year 04 | 16.01.2006 | Renewal fee patent year 05 | 05.01.2007 | Renewal fee patent year 06 | 08.01.2008 | Renewal fee patent year 07 |
| Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | GB | 18.01.2009 | [2010/01] | Cited in | International search | [A]JPH0935055 (NEC CORP); | [A]US5680481 (PRASAD K VENKATESH [US], et al); | [A]EP0889438 (AGFA GEVAERT NV [BE]); | [A]US5889892 (SAITO SHIGERU [JP]); | [A]JPH11332848 (YOKOGAWA MEDICAL SYST) |