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Extract from the Register of European Patents

EP About this file: EP1352976

EP1352976 - Probe array [Right-click to bookmark this link]
Former [2003/42]Method of spotting probe on solid support, probe array and method of manufacturing thereof, and method of detecting target substance and method of identifying structure of target substance using probe array
[2011/40]
StatusNo opposition filed within time limit
Status updated on  19.07.2013
Database last updated on 24.04.2024
Most recent event   Tooltip09.08.2013Lapse of the patent in a contracting state
New state(s): IT		published on 11.09.2013  [2013/37]
Applicant(s)For all designated states
CANON KABUSHIKI KAISHA
30-2, 3-chome, Shimomaruko, Ohta-ku
Tokyo / JP
[2012/37]
Former [2003/42]For all designated states
CANON KABUSHIKI KAISHA
30-2, 3-chome, Shimomaruko, Ohta-ku
Tokyo / JP
Inventor(s)01 / Okamoto, Tadashi C/0 Canon Kabushiki Kaisha
30-2, 3-chome
Shimomaruko
Ohta-ku Tokyo / JP
02 / Yamamoto, Nobuko c/o Canon Kabushiki Kaisha
30-2, 3-chome
Shimomaruko
Ohta-ku Tokyo / JP
03 / Suzuki, Tomohiro c/o Canon Kabushiki Kaisha
30-2, 3-chome
Shimomaruko
Ohta-ku Tokyo / JP
 [2012/37]
Former [2003/42]01 / Okamoto, Tadashi C/0 Canon Kabushiki Kaisha
30-2, 3-chome Shimomaruko
Ohta-ku Tokyo / JP
02 / Yamamoto, Nobuko c/o Canon Kabushiki Kaisha
30-2, 3-chome Shimomaruko
Ohta-ku Tokyo / JP
03 / Suzuki, Tomohiro c/o Canon Kabushiki Kaisha
30-2, 3-chome Shimomaruko
Ohta-ku Tokyo / JP
Representative(s)Weser, Wolfgang, et al
Weser & Kollegen
Patentanwälte
Radeckestrasse 43
81245 München / DE
[N/P]
Former [2012/37]Weser, Wolfgang, et al
Weser & Kollegen Patentanwälte Radeckestrasse 43
81245 München / DE
Former [2008/21]Weser, Wolfgang, et al
Weser & Kollegen, Patentanwälte Radeckestrasse 43
81245 München / DE
Former [2003/42]Beresford, Keith Denis Lewis, et al
BERESFORD & Co. 2-5 Warwick Court, High Holborn
London WC1R 5DH / GB
Application number, filing date03076692.731.07.1998
[2003/42]
Priority number, dateJP1997020783701.08.1997         Original published format: JP 20783797
JP1997028704620.10.1997         Original published format: JP 28704697
JP1998020992324.07.1998         Original published format: JP 20992398
[2003/42]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP1352976
Date:15.10.2003
Language:EN
[2003/42]
Type: A3 Search report 
No.:EP1352976
Date:29.10.2003
[2003/44]
Type: B1 Patent specification 
No.:EP1352976
Date:12.09.2012
Language:EN
[2012/37]
Search report(s)(Supplementary) European search report - dispatched on:EP16.09.2003
ClassificationIPC:C12Q1/68, G01N33/543, G01N33/68, C12N11/14, B01J19/00, B01L3/02, C07B61/00, C07H21/00
[2003/42]
CPC:
B01L3/0268 (EP,US); B01J19/0046 (EP,US); C07H21/00 (EP,US);
C12N11/14 (EP,US); C12N15/11 (EP,US); C12Q1/00 (EP,US);
C12Q1/6837 (EP,US); C40B30/04 (EP,US); C40B50/14 (EP,US);
G01N33/54366 (EP,US); G01N33/68 (EP,US); G01N33/6845 (EP,US);
B01J2219/00274 (EP,US); B01J2219/00315 (EP,US); B01J2219/00317 (EP,US);
B01J2219/00378 (EP,US); B01J2219/00432 (EP,US); B01J2219/00497 (EP,US);
B01J2219/00527 (EP,US); B01J2219/00585 (EP,US); B01J2219/00596 (EP,US);
B01J2219/00605 (EP,US); B01J2219/00612 (EP,US); B01J2219/00619 (EP,US);
B01J2219/00621 (EP,US); B01J2219/00626 (EP,US); B01J2219/00637 (EP,US);
B01J2219/00659 (EP,US); B01J2219/00677 (EP,US); B01J2219/00702 (EP,US);
B01J2219/00722 (EP,US); B01J2219/00725 (EP,US); B01J2219/00729 (EP,US);
B01L2200/143 (EP,US); B01L2400/0442 (EP,US); B82Y30/00 (EP,US);
C07B2200/11 (EP,US); C12N2310/351 (EP,US); C40B40/06 (EP,US);
C40B40/10 (EP,US); C40B60/14 (EP,US); G01N2035/00158 (EP,US) (-)
Designated contracting statesAT,   BE,   CH,   CY,   DE,   DK,   ES,   FI,   FR,   GB,   GR,   IE,   IT,   LI,   LU,   NL,   PT,   SE [2003/42]
TitleGerman:Sondenarray[2011/40]
English:Probe array[2011/40]
French:Réseau de sondes[2011/40]
Former [2003/42]Verfahren zur Probenaufgabe auf festen Trägern, Sondenarray und Verfahren zu seiner Herstellung, und Verfahren zum Nachweis einer Zielsubstanz und Verfahren zur Identifizierung der Struktur der Zielsubstanz unter Benutzung von Sondenarrays
Former [2003/42]Method of spotting probe on solid support, probe array and method of manufacturing thereof, and method of detecting target substance and method of identifying structure of target substance using probe array
Former [2003/42]Procédé pour déposer des échantillons sur des supports solides, réseau de sondes et procédé de sa fabrication, et procédé de détection d'un substance cible et procédé d'identification de structure d'un substance cible utilisant des réseau de sondes
Examination procedure26.03.2004Examination requested  [2004/22]
28.02.2007Despatch of a communication from the examining division (Time limit: M06)
05.09.2007Reply to a communication from the examining division
24.04.2009Despatch of a communication from the examining division (Time limit: M04)
31.08.2009Reply to a communication from the examining division
07.02.2011Despatch of a communication from the examining division (Time limit: M06)
16.08.2011Reply to a communication from the examining division
26.09.2011Communication of intention to grant the patent
25.01.2012Fee for grant paid
25.01.2012Fee for publishing/printing paid
Parent application(s)   TooltipEP98306107.8  / EP0895082
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued (EP19980306107) is  26.10.2000
Opposition(s)13.06.2013No opposition filed within time limit [2013/34]
Fees paidRenewal fee
18.06.2003Renewal fee patent year 03
18.06.2003Renewal fee patent year 04
18.06.2003Renewal fee patent year 05
23.07.2003Renewal fee patent year 06
22.07.2004Renewal fee patent year 07
20.07.2005Renewal fee patent year 08
31.07.2006Renewal fee patent year 09
31.07.2007Renewal fee patent year 10
13.03.2008Renewal fee patent year 11
31.07.2009Renewal fee patent year 12
02.08.2010Renewal fee patent year 13
01.08.2011Renewal fee patent year 14
31.07.2012Renewal fee patent year 15
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT12.09.2012
BE12.09.2012
CY12.09.2012
DK12.09.2012
FI12.09.2012
IT12.09.2012
NL12.09.2012
SE12.09.2012
GR13.12.2012
ES23.12.2012
PT14.01.2013
[2013/37]
Former [2013/34]AT12.09.2012
BE12.09.2012
CY12.09.2012
DK12.09.2012
FI12.09.2012
NL12.09.2012
SE12.09.2012
GR13.12.2012
ES23.12.2012
PT14.01.2013
Former [2013/31]AT12.09.2012
BE12.09.2012
CY12.09.2012
FI12.09.2012
NL12.09.2012
SE12.09.2012
GR13.12.2012
ES23.12.2012
PT14.01.2013
Former [2013/28]BE12.09.2012
CY12.09.2012
FI12.09.2012
NL12.09.2012
SE12.09.2012
GR13.12.2012
ES23.12.2012
PT14.01.2013
Former [2013/22]BE12.09.2012
CY12.09.2012
FI12.09.2012
NL12.09.2012
SE12.09.2012
GR13.12.2012
ES23.12.2012
Former [2013/20]BE12.09.2012
CY12.09.2012
FI12.09.2012
SE12.09.2012
GR13.12.2012
Former [2013/12]CY12.09.2012
FI12.09.2012
SE12.09.2012
GR13.12.2012
Former [2013/11]CY12.09.2012
FI12.09.2012
GR13.12.2012
Former [2013/10]CY12.09.2012
FI12.09.2012
Former [2013/09]FI12.09.2012
Documents cited:Search[X]JPH0954093  ;
 [A]JPS5921391  ;
 [A]JPH04359072  ;
 [A]JPH07179797  ;
 [A]JPH0666799  ;
 [A]US5108926  (KLEBE ROBERT J [US]) [A] 1,23-25 * column 9, line 1 - line 19 * * column 4, line 35 - line 41 * * column 3, line 31 - line 32 * * column 3, lines 1-22 *;
 [A]US5324650  (OBZANSKY DAVID M [US], et al) [A] 7-11,48,49,64,87-91,127-131 * column 4, line 4 - line 14 * * column A; example 1 *;
 [DX]US5405783  (PIRRUNG MICHAEL C [US], et al) [DX] 41-47,52-56,58-63,68-76,80,121 * column A; claim - * * column 6, line 44 - column 7, line 68 * * column 11, line 37 - line 40 * * column 11, line 55 - column 12, line 18 *;
 [DXA]US5474796  (BRENNAN THOMAS M [US]) [DX] 41-47,51-56,80 * column 2, line 10 - column 3, line 35 * [A] 1-6,23-29,81-86,103-109,121-126,143-149;
 [A]WO9535505  (UNIV LELAND STANFORD JUNIOR [US]) [A] 30,33,35-37,39,40,57,78,79,113,115-117,119,120,150,153,155-157,159,160 * page 18, line 16 - line 21 * * page 23, line 30 - page 25, line 33 * * figure 11 *;
 [A]US5601980  (GORDON GARY B [US], et al);
 [X]  - PATENT ABSTRACTS OF JAPAN, (19970630), vol. 097, no. 006, & JP09054093 A 19970225 (ADTEC KK) [X] 1-6,23-27,29,81-86,103-107,109,121-126,143-147,149 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19840518), vol. 008, no. 106, Database accession no. (C - 223), & JP59021391 A 19840203 (SHIMAZU SEISAKUSHO KK) [A] 13,14,50,66,93,94,133,134 * abstract *
 [A]  - DATABASE WPI, 1, Derwent World Patents Index, vol. 93, no. 04, Database accession no. 93-031735, XP002105850 & JPH04359072 A 19921211 (SEIKO EPSON CORP) [A] 16,17,96,97,136,137 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19951130), vol. 095, no. 010, & JP07179797 A 19950718 (CANON INC) [A] 16,22,96,102,136,142 * abstract *
 [A]  - PATENT ABSTRACTS OF JAPAN, (19940610), vol. 018, no. 306, Database accession no. (P - 1752), & JP06066799 A 19940311 (S R L:KK) [A] 31,32,111,112,151,152 * abstract *
 [A]  - O'DONNELL-MALONEY M J ET AL, "Microfabrication and array technologies for DNA sequencing and diagnostics", GENETIC ANALYSIS: BIOMOLECULAR ENGINEERING, ELSEVIER SCIENCE PUBLISHING, US, (19961201), vol. 13, no. 6, ISSN 1050-3862, pages 151 - 157, XP004017264

DOI:   http://dx.doi.org/10.1016/S1050-3862(96)00166-0
 [A]  - CHRISEY L A ET AL, "FABRICATION OF PATTERNED DNA SURFACES", NUCLEIC ACIDS RESEARCH, OXFORD UNIVERSITY PRESS, SURREY, GB, (1996), vol. 24, no. 15, ISSN 0305-1048, pages 3040 - 3047, XP002913337

DOI:   http://dx.doi.org/10.1093/nar/24.15.3040
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.