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Extract from the Register of European Patents

EP About this file: EP1761953

EP1761953 - TRENCH MOSFET WITH RECESSED CLAMPING DIODE [Right-click to bookmark this link]
StatusThe application has been refused
Status updated on  08.01.2016
Database last updated on 20.05.2024
Most recent event   Tooltip08.01.2016Refusal of applicationpublished on 10.02.2016  [2016/06]
Applicant(s)For all designated states
Advanced Analogic Technologies, Inc.
830 East Arques Avenue
Sunnyvale, CA 94085-4519 / US
For all designated states
Advanced Analogic Technologies (Hong Kong) Limited
Unit 12, 17F, North Tower, Concordia Plaza, No.1 Science Museum Road Tsimshatsui
Kowloon, Hong Kong / CN
[2007/11]
Inventor(s)01 / WILLIAMS, Richard
10292 Norwich Avenue
Cupertino, CA 95014 / US
02 / CORNELL, Michael
1576 Summerfield Drive
Campbell, CA 95008 / US
03 / Chan, Wai Tien 2/F, House 80B, JC Castle
18 Shan Tong Road
Tai Po, N.T. / HK
 [2007/25]
Former [2007/11]01 / WILLIAMS, Richard
10292 Norwich Avenue
Cupertino, CA 95014 / US
02 / CORNELL, Michael
1576 Summerfield Drive
Campbell, CA 95008 / US
03 / Chan, Wai Tien
Flat F, 23/F, Block 5, Regentville, Fanling
New Terrirtories, Hong Kong / CN
Representative(s)Lloyd, Patrick Alexander Desmond
Reddie & Grose LLP The White Chapel Building
10 Whitechapel High Street
London E1 8QS / GB
[N/P]
Former [2012/50]Lloyd, Patrick Alexander Desmond
Reddie & Grose LLP
16 Theobalds Road
London WC1X 8PL / GB
Former [2009/49]Freeman, Jacqueline Carol
W.P.Thompson & Co. 55 Drury Lane
London WC2B 5SQ / GB
Former [2007/11]Freeman, Jacqueline Carol
W.P. Thompson & Co. 55 Drury Lane
London WC2B 5SQ / GB
Application number, filing date04756535.330.06.2004
[2007/11]
WO2004US21211
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2006011882
Date:02.02.2006
Language:EN
[2006/05]
Type: A1 Application with search report 
No.:EP1761953
Date:14.03.2007
Language:EN
The application published by WIPO in one of the EPO official languages on 02.02.2006 takes the place of the publication of the European patent application.
[2007/11]
Search report(s)International search report - published on:US02.02.2006
(Supplementary) European search report - dispatched on:EP26.01.2009
ClassificationIPC:H01L27/108, H01L29/76, H01L29/94, H01L31/119, H01L29/06
[2009/09]
CPC:
H01L29/7813 (EP,US); H01L29/0878 (EP,US); H01L29/66734 (EP);
H01L29/7808 (EP); H01L29/0696 (EP); H01L29/42368 (EP)
Former IPC [2007/11]H01L27/108, H01L29/76, H01L29/94, H01L31/119
Designated contracting statesAT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HU,   IE,   IT,   LI,   LU,   MC,   NL,   PL,   PT,   RO,   SE,   SI,   SK,   TR [2007/11]
Extension statesALNot yet paid
HRNot yet paid
LTNot yet paid
LVNot yet paid
MKNot yet paid
TitleGerman:GRABEN-MOSFET MIT AUSGESPARTER KLEMMDIODE[2007/11]
English:TRENCH MOSFET WITH RECESSED CLAMPING DIODE[2007/11]
French:TRANSISTOR MOS A TRANCHES COMPRENANT UNE DIODE DE BLOCAGE[2007/11]
Entry into regional phase10.11.2006National basic fee paid 
10.11.2006Search fee paid 
10.11.2006Designation fee(s) paid 
10.11.2006Examination fee paid 
Examination procedure10.11.2006Examination requested  [2007/11]
01.03.2007Amendment by applicant (claims and/or description)
25.05.2009Despatch of a communication from the examining division (Time limit: M06)
26.11.2009Reply to a communication from the examining division
04.10.2010Despatch of a communication from the examining division (Time limit: M06)
13.04.2011Reply to a communication from the examining division
20.08.2012Despatch of a communication from the examining division (Time limit: M06)
20.02.2013Reply to a communication from the examining division
16.09.2015Cancellation of oral proceeding that was planned for 01.10.2015
23.09.2015Despatch of communication that the application is refused, reason: substantive examination [2016/06]
01.10.2015Date of oral proceedings (cancelled)
03.10.2015Application refused, date of legal effect [2016/06]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  25.05.2009
Fees paidRenewal fee
10.11.2006Renewal fee patent year 03
14.06.2007Renewal fee patent year 04
25.06.2008Renewal fee patent year 05
26.06.2009Renewal fee patent year 06
25.06.2010Renewal fee patent year 07
27.06.2011Renewal fee patent year 08
26.06.2012Renewal fee patent year 09
10.06.2013Renewal fee patent year 10
30.06.2014Renewal fee patent year 11
29.06.2015Renewal fee patent year 12
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]US5637898  (BALIGA BANTVAL J [US]) [A] 7* abstract *;
 [A]EP0801426  (HARRIS CORP [US]) [A] 12 * Fig. 3C and related text *;
 [A]US6049108  (WILLIAMS RICHARD K [US], et al) [A] 4,5 * column 7, line 22 - column 8, line 19; figure 4 *;
 [DX]US6291298  (WILLIAMS RICHARD K [US], et al) [DX] 1-25 * Fig. 30 and related text *;
 [DA]US6413822  (WILLIAMS RICHARD K [US], et al) [DA] 14-16,21-24 * Fig. 24A-Q and related text *
International search[X]US6198127  (KOCON CHRISTOPHER B [US]);
 [Y]US5998836  (WILLIAMS RICHARD K [US]);
 [Y]US5929481  (HSHIEH FWU-IUAN [US], et al);
 [Y]US6511885  (HARADA HIROFUMI [JP], et al)
ExaminationUS5072266
 WO0201644
by applicantUS6291298
 US6413822
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.