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Extract from the Register of European Patents

EP About this file: EP2942600

EP2942600 - METHOD AND DEVICE FOR MEASURING MISALIGNMENT AND TILT OF AREAS OF AN OPTICAL ELEMENT [Right-click to bookmark this link]
StatusExamination is in progress
Status updated on  13.04.2018
Database last updated on 11.05.2024
Most recent event   Tooltip19.03.2024New entry: Renewal fee paid 
Applicant(s)For all designated states
asphericon GmbH
Stockholmer Strasse 9
07747 Jena / DE
[2015/46]
Inventor(s)01 / Kiontke, Sven
Stockholmer Straße 9
07747 Jena / DE
 [2015/46]
Representative(s)Liedtke, Markus
Liedtke & Partner
Patentanwälte
Gerhart-Hauptmann-Straße 10/11
99096 Erfurt / DE
[N/P]
Former [2015/46]Liedtke, Markus
Liedtke & Partner Patentanwälte
Gerhart-Hauptmann-Straße 10/11
99096 Erfurt / DE
Application number, filing date15166864.708.05.2015
[2015/46]
Priority number, dateDE20141020863608.05.2014         Original published format: DE102014208636
[2015/46]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP2942600
Date:11.11.2015
Language:DE
[2015/46]
Search report(s)(Supplementary) European search report - dispatched on:EP09.10.2015
ClassificationIPC:G01B11/25, G01B11/24, G01B11/27, G01M11/02
[2015/46]
CPC:
G01B11/25 (EP,US); G01B11/2441 (EP,US); G01B11/27 (EP,US);
G01M11/0221 (EP,US); G01M11/0271 (US)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2016/02]
Former [2015/46]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
Extension statesBANot yet paid
MENot yet paid
Validation statesMANot yet paid
TitleGerman:VERFAHREN UND VORRICHTUNG ZUR MESSUNG EINER DEZENTRIERUNG UND VERKIPPUNG VON FLÄCHEN EINES OPTISCHEN ELEMENTS[2015/46]
English:METHOD AND DEVICE FOR MEASURING MISALIGNMENT AND TILT OF AREAS OF AN OPTICAL ELEMENT[2015/46]
French:PROCÉDÉ ET DISPOSITIF DE MESURE D'UN DÉCENTRAGE ET BASCULEMENT DE SURFACES D'UN ÉLÉMENT OPTIQUE[2015/46]
Examination procedure02.12.2015Amendment by applicant (claims and/or description)
02.12.2015Examination requested  [2016/02]
11.04.2018Despatch of a communication from the examining division (Time limit: M04)
07.08.2018Reply to a communication from the examining division
05.11.2020Despatch of a communication from the examining division (Time limit: M04)
05.03.2021Reply to a communication from the examining division
23.11.2021Date of oral proceedings
06.12.2021Minutes of oral proceedings despatched
08.12.2021Despatch of communication that the application is refused, reason: substantive examination {1}
Appeal following examination04.02.2022Appeal received No.  T0724/22
07.02.2022Payment of appeal fee
08.03.2022Statement of grounds filed
13.09.2024Date of oral proceedings
Fees paidRenewal fee
29.03.2017Renewal fee patent year 03
26.03.2018Renewal fee patent year 04
29.04.2019Renewal fee patent year 05
27.03.2020Renewal fee patent year 06
27.04.2021Renewal fee patent year 07
29.03.2022Renewal fee patent year 08
29.03.2023Renewal fee patent year 09
18.03.2024Renewal fee patent year 10
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Documents cited:Search[XY]US2006209294  (MURATA YASUNORI [JP]) [X] 1,6,10 * paragraph [0041] - paragraph [0110] * * abstract * [Y] 2,3,7-9;
 [XY]EP2228623  (FUJINON CORP [JP]) [X] 1,4-6,10,11 * abstract * * paragraphs [0001] , [0047] - paragraph [0086] * * paragraph [0088] - paragraph [0094] * [Y] 2,3,7-9;
 [XYI]JP5334227B  (ENABLE K K, OGAWA HIDEKI) [X] 1,6 * abstract * * paragraph [0031] - paragraph [0155] * [Y] 2,3,7-9 [I] 4,5,10,11;
 [Y]FR2838512  (ESSILOR INT [FR]) [Y] 2,3,7-9 * the whole document *
by applicantDE102006052047
 DE19637682
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.