EP2942600 - METHOD AND DEVICE FOR MEASURING MISALIGNMENT AND TILT OF AREAS OF AN OPTICAL ELEMENT [Right-click to bookmark this link] | Status | Examination is in progress Status updated on 13.04.2018 Database last updated on 11.05.2024 | Most recent event Tooltip | 19.03.2024 | New entry: Renewal fee paid | Applicant(s) | For all designated states asphericon GmbH Stockholmer Strasse 9 07747 Jena / DE | [2015/46] | Inventor(s) | 01 /
Kiontke, Sven Stockholmer Straße 9 07747 Jena / DE | [2015/46] | Representative(s) | Liedtke, Markus Liedtke & Partner Patentanwälte Gerhart-Hauptmann-Straße 10/11 99096 Erfurt / DE | [N/P] |
Former [2015/46] | Liedtke, Markus Liedtke & Partner Patentanwälte Gerhart-Hauptmann-Straße 10/11 99096 Erfurt / DE | Application number, filing date | 15166864.7 | 08.05.2015 | [2015/46] | Priority number, date | DE201410208636 | 08.05.2014 Original published format: DE102014208636 | [2015/46] | Filing language | DE | Procedural language | DE | Publication | Type: | A1 Application with search report | No.: | EP2942600 | Date: | 11.11.2015 | Language: | DE | [2015/46] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 09.10.2015 | Classification | IPC: | G01B11/25, G01B11/24, G01B11/27, G01M11/02 | [2015/46] | CPC: |
G01B11/25 (EP,US);
G01B11/2441 (EP,US);
G01B11/27 (EP,US);
G01M11/0221 (EP,US);
G01M11/0271 (US)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2016/02] |
Former [2015/46] | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR | Extension states | BA | Not yet paid | ME | Not yet paid | Validation states | MA | Not yet paid | Title | German: | VERFAHREN UND VORRICHTUNG ZUR MESSUNG EINER DEZENTRIERUNG UND VERKIPPUNG VON FLÄCHEN EINES OPTISCHEN ELEMENTS | [2015/46] | English: | METHOD AND DEVICE FOR MEASURING MISALIGNMENT AND TILT OF AREAS OF AN OPTICAL ELEMENT | [2015/46] | French: | PROCÉDÉ ET DISPOSITIF DE MESURE D'UN DÉCENTRAGE ET BASCULEMENT DE SURFACES D'UN ÉLÉMENT OPTIQUE | [2015/46] | Examination procedure | 02.12.2015 | Amendment by applicant (claims and/or description) | 02.12.2015 | Examination requested [2016/02] | 11.04.2018 | Despatch of a communication from the examining division (Time limit: M04) | 07.08.2018 | Reply to a communication from the examining division | 05.11.2020 | Despatch of a communication from the examining division (Time limit: M04) | 05.03.2021 | Reply to a communication from the examining division | 23.11.2021 | Date of oral proceedings | 06.12.2021 | Minutes of oral proceedings despatched | 08.12.2021 | Despatch of communication that the application is refused, reason: substantive examination {1} | Appeal following examination | 04.02.2022 | Appeal received No. T0724/22 | 07.02.2022 | Payment of appeal fee | 08.03.2022 | Statement of grounds filed | 13.09.2024 | Date of oral proceedings | Fees paid | Renewal fee | 29.03.2017 | Renewal fee patent year 03 | 26.03.2018 | Renewal fee patent year 04 | 29.04.2019 | Renewal fee patent year 05 | 27.03.2020 | Renewal fee patent year 06 | 27.04.2021 | Renewal fee patent year 07 | 29.03.2022 | Renewal fee patent year 08 | 29.03.2023 | Renewal fee patent year 09 | 18.03.2024 | Renewal fee patent year 10 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [XY]US2006209294 (MURATA YASUNORI [JP]) [X] 1,6,10 * paragraph [0041] - paragraph [0110] * * abstract * [Y] 2,3,7-9; | [XY]EP2228623 (FUJINON CORP [JP]) [X] 1,4-6,10,11 * abstract * * paragraphs [0001] , [0047] - paragraph [0086] * * paragraph [0088] - paragraph [0094] * [Y] 2,3,7-9; | [XYI]JP5334227B (ENABLE K K, OGAWA HIDEKI) [X] 1,6 * abstract * * paragraph [0031] - paragraph [0155] * [Y] 2,3,7-9 [I] 4,5,10,11; | [Y]FR2838512 (ESSILOR INT [FR]) [Y] 2,3,7-9 * the whole document * | by applicant | DE102006052047 | DE19637682 |