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Extract from the Register of European Patents

EP About this file: EP3722817

EP3722817 - ACTIVE BIMODAL AFM OPERATION FOR MEASUREMENTS OF OPTICAL INTERACTION [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  17.03.2023
Database last updated on 24.04.2024
FormerThe patent has been granted
Status updated on  08.04.2022
FormerGrant of patent is intended
Status updated on  09.11.2021
FormerExamination is in progress
Status updated on  14.05.2021
FormerRequest for examination was made
Status updated on  03.04.2021
FormerThe application has been published
Status updated on  11.09.2020
Most recent event   Tooltip09.02.2024Lapse of the patent in a contracting state
New state(s): IT
published on 13.03.2024  [2024/11]
Applicant(s)For all designated states
attocube systems AG
Eglfinger Weg 2
85540 Haar / DE
[2021/04]
Former [2020/42]For all designated states
Neaspec GmbH
Eglfinger Weg 2
85540 Haar / DE
Inventor(s)01 / Govyadinov, Alexander A.
85540 Haar / DE
02 / Huth, Florian
85540 Haar / DE
03 / Malovichko, Ivan
85540 Haar / DE
04 / Diem, Marcus
85540 Haar / DE
 [2022/19]
Former [2020/42]01 / Govyadinov, Alexander A.
Neaspec GmbH
c/o Neaspec GmbH
Eglfinger Weg 2
85540 Haar / DE
02 / Huth, Florian
Neaspec GmbH
c/o Neaspec GmbH
Eglfinger Weg 2
85540 Haar / DE
03 / Malovichko, Ivan
Neaspec GmbH
c/o Neaspec GmbH
Eglfinger Weg 2
85540 Haar / DE
04 / Diem, Marcus
Neaspec GmbH
c/o Neaspec GmbH
Eglfinger Weg 2
85540 Haar / DE
Representative(s)Hartz, Nikolai
Wächtershäuser & Hartz
Patentanwaltspartnerschaft mbB
Weinstrasse 8
80333 München / DE
[N/P]
Former [2020/42]Schiener, Jens
Wächtershäuser & Hartz
Patentanwaltspartnerschaft mbB
Weinstraße 8
80333 München / DE
Application number, filing date19168958.712.04.2019
[2020/42]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP3722817
Date:14.10.2020
Language:EN
[2020/42]
Type: B1 Patent specification 
No.:EP3722817
Date:11.05.2022
Language:EN
[2022/19]
Search report(s)(Supplementary) European search report - dispatched on:EP05.12.2019
ClassificationIPC:G01Q60/32, G01Q60/34
[2020/42]
CPC:
G01Q60/34 (EP,US); G01Q30/02 (US); G01Q60/30 (US);
G01Q60/363 (EP,US); G01Q60/38 (US)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2021/18]
Former [2020/42]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
TitleGerman:AKTIVER BIMODALER AFM-BETRIEB ZUR MESSUNGEN OPTISCHER INTERAKTION[2020/42]
English:ACTIVE BIMODAL AFM OPERATION FOR MEASUREMENTS OF OPTICAL INTERACTION[2020/42]
French:OPÉRATION BIMODALE AFM ACTIVE POUR DES MESURES D'INTERACTION OPTIQUE[2020/42]
Examination procedure30.03.2021Amendment by applicant (claims and/or description)
30.03.2021Examination requested  [2021/18]
30.03.2021Date on which the examining division has become responsible
17.05.2021Despatch of a communication from the examining division (Time limit: M04)
09.09.2021Reply to a communication from the examining division
10.11.2021Communication of intention to grant the patent
28.02.2022Fee for grant paid
28.02.2022Fee for publishing/printing paid
28.02.2022Receipt of the translation of the claim(s)
Opposition(s)14.02.2023No opposition filed within time limit [2023/16]
Fees paidRenewal fee
30.04.2021Renewal fee patent year 03
31.03.2022Renewal fee patent year 04
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See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAL11.05.2022
CZ11.05.2022
DK11.05.2022
EE11.05.2022
ES11.05.2022
FI11.05.2022
HR11.05.2022
IT11.05.2022
LT11.05.2022
LV11.05.2022
MC11.05.2022
NL11.05.2022
PL11.05.2022
RO11.05.2022
RS11.05.2022
SE11.05.2022
SI11.05.2022
SK11.05.2022
SM11.05.2022
BG11.08.2022
NO11.08.2022
GR12.08.2022
IS11.09.2022
PT12.09.2022
[2024/11]
Former [2024/08]AL11.05.2022
CZ11.05.2022
DK11.05.2022
EE11.05.2022
ES11.05.2022
FI11.05.2022
HR11.05.2022
LT11.05.2022
LV11.05.2022
MC11.05.2022
NL11.05.2022
PL11.05.2022
RO11.05.2022
RS11.05.2022
SE11.05.2022
SI11.05.2022
SK11.05.2022
SM11.05.2022
BG11.08.2022
NO11.08.2022
GR12.08.2022
IS11.09.2022
PT12.09.2022
Former [2023/25]AL11.05.2022
CZ11.05.2022
DK11.05.2022
EE11.05.2022
ES11.05.2022
FI11.05.2022
HR11.05.2022
LT11.05.2022
LV11.05.2022
NL11.05.2022
PL11.05.2022
RO11.05.2022
RS11.05.2022
SE11.05.2022
SI11.05.2022
SK11.05.2022
SM11.05.2022
BG11.08.2022
NO11.08.2022
GR12.08.2022
IS11.09.2022
PT12.09.2022
Former [2023/17]AL11.05.2022
CZ11.05.2022
DK11.05.2022
EE11.05.2022
ES11.05.2022
FI11.05.2022
HR11.05.2022
LT11.05.2022
LV11.05.2022
NL11.05.2022
PL11.05.2022
RO11.05.2022
RS11.05.2022
SE11.05.2022
SK11.05.2022
SM11.05.2022
BG11.08.2022
NO11.08.2022
GR12.08.2022
IS11.09.2022
PT12.09.2022
Former [2023/09]CZ11.05.2022
DK11.05.2022
EE11.05.2022
ES11.05.2022
FI11.05.2022
HR11.05.2022
LT11.05.2022
LV11.05.2022
NL11.05.2022
PL11.05.2022
RO11.05.2022
RS11.05.2022
SE11.05.2022
SK11.05.2022
SM11.05.2022
BG11.08.2022
NO11.08.2022
GR12.08.2022
IS11.09.2022
PT12.09.2022
Former [2023/07]DK11.05.2022
ES11.05.2022
FI11.05.2022
HR11.05.2022
LT11.05.2022
LV11.05.2022
NL11.05.2022
PL11.05.2022
RS11.05.2022
SE11.05.2022
BG11.08.2022
NO11.08.2022
GR12.08.2022
IS11.09.2022
PT12.09.2022
Former [2022/51]ES11.05.2022
FI11.05.2022
HR11.05.2022
LT11.05.2022
LV11.05.2022
NL11.05.2022
PL11.05.2022
RS11.05.2022
SE11.05.2022
BG11.08.2022
NO11.08.2022
GR12.08.2022
IS11.09.2022
PT12.09.2022
Former [2022/50]ES11.05.2022
FI11.05.2022
HR11.05.2022
LT11.05.2022
LV11.05.2022
NL11.05.2022
PL11.05.2022
RS11.05.2022
SE11.05.2022
BG11.08.2022
NO11.08.2022
GR12.08.2022
PT12.09.2022
Former [2022/49]ES11.05.2022
FI11.05.2022
HR11.05.2022
LT11.05.2022
LV11.05.2022
NL11.05.2022
SE11.05.2022
BG11.08.2022
NO11.08.2022
GR12.08.2022
PT12.09.2022
Former [2022/48]ES11.05.2022
FI11.05.2022
LT11.05.2022
NL11.05.2022
SE11.05.2022
NO11.08.2022
PT12.09.2022
Former [2022/47]ES11.05.2022
FI11.05.2022
LT11.05.2022
SE11.05.2022
NO11.08.2022
PT12.09.2022
Documents cited:Search[YDA]US9134341  (PRATER CRAIG [US], et al) [YD] 1,3-15 * figures 3,4 * * column 5, line 25 - column 8, line 41 * * column 8, line 61 - column 9, line 21 * [A] 16;
 [YA]  - DANA C KOHLGRAF-OWENS ET AL, "Multi-frequency near-field scanning optical microscopy", NANOTECHNOLOGY, IOP, BRISTOL, GB, vol. 25, no. 3, doi:10.1088/0957-4484/25/3/035203, ISSN 0957-4484, (20131217), page 35203, (20131217), XP020256585 [Y] 16 * figures 1,2 * * paragraph [02.1] - paragraph [02.3] * * paragraph [0003] * [A] 1,3-15

DOI:   http://dx.doi.org/10.1088/0957-4484/25/3/035203
 [Y]  - ELENA T. HERRUZO ET AL, "Fast nanomechanical spectroscopy of soft matter", NATURE COMMUNICATIONS, GB, (20140120), vol. 5, doi:10.1038/ncomms4126, ISSN 2041-1723, XP055294212 [Y] 1,3-16 * figure 1 * * paragraph [Bimodal] - paragraph [Theory] *

DOI:   http://dx.doi.org/10.1038/ncomms4126
by applicantUS8001830
 WO2012021727
 US2012204296
 US8402819
 US9134341
    - AMBROSIO, A.; DEVLIN, R. C.; CAPASSO, F.; WILSON, W. L., "Observation of Nanoscale Refractive Index Contrast via Photoinduced Force Microscopy", ACS Photonics, vol. 4, no. 4, (20170000), pages 846 - 851, URL: https://doi.org/10.1021/acsphotonics.6b00911
    - CVITKOVIC, A.; OCELIC, N.; HILLENBRAND, R., "Analytical model for quantitative prediction of material contrasts in scattering-type near-field optical microscopy", Optics Express, vol. 15, no. 14, doi:doi:10.1364/OE.15.008550, (20070000), pages 8550 - 8565, URL: https://doi.org/10.1364/OE.15.008550, XP055017766

DOI:   http://dx.doi.org/10.1364/OE.15.008550
    - DAZZI, A.; PRAZERES, R.; GLOTIN, F.; ORTEGA, J. M., "Local infrared microspectroscopy with subwavelength spatial resolution with an atomic force microscope tip used as a photothermal sensor", Optics Letters, vol. 30, no. 18, doi:doi:10.1364/OL.30.002388, (20050000), page 2388, URL: https://doi.org/1 0.1364/OL.30.002388, XP007911868

DOI:   http://dx.doi.org/10.1364/OL.30.002388
    - HUBER, A. J.; KEILMANN, F.; WITTBORN, J.; AIZPURUA, J.; HILLENBRAND, R., "Terahertz near-field nanoscopy of mobile carriers in single semiconductor nanodevices", Nano Letters, vol. 8, no. 11, (20080000), pages 3766 - 3770, URL: https://doi.org/10.1021/nl802086x
    - JAHNG, J.; BROCIOUS, J.; FISHMAN, D. A.; HUANG, F.; LI, X.; TAMMA, V. A.; POTMA, E. O., "Gradient and scattering forces in photoinduced force microscopy", Physical Review B - Condensed Matter and Materials Physics, vol. 90, no. 15, (20140000), page 155417, URL: https://doi.org/1 O. 1 103/PhysRevB.90. 155417
    - LOZANO, J. R.; KIRACOFE, D.; MELCHER, J.; GARCIA, R.; RAMAN, A., "Calibration of higher eigenmode spring constants of atomic force microscope cantilevers", Nanotechnology, vol. 21, no. 46, doi:doi:10.1088/0957-4484/21/46/465502, (20100000), URL: https://doi.org/10.1088/0957-4484/21/46/465502, XP020199964

DOI:   http://dx.doi.org/10.1088/0957-4484/21/46/465502
    - O'CALLAHAN, B. T.; YAN, J.; MENGES, F.; MULLER, E. A.; RASCHKE, M. B., "Photoinduced Tip-Sample Forces for Chemical Nanoimaging and Spectroscopy", Nano Letters, vol. 18, no. 9, (20180000), pages 5499 - 5505, URL: https://doi.org/10.1021/acs.nanolett.8b01899
    - ORDAL, M. A; BELL, R. J.; ALEXANDER, R. W.; LONG, L. L.; QUERRY, M. R., "Optical properties of fourteen metals in the infrared and far infrared: Al, Co, Cu, Au, Fe, Pb, Mo, Ni, Pd, Pt, Ag, Ti, V, and W", Applied Optics, vol. 24, no. 24, (19850000), page 4493, URL: http://www.ncbi.nlm.nih.gov/pubmed/18224235
    - TUTEJA, M.; KANG, M.; LEAL, C.; CENTRONE, A., "Nanoscale partitioning of paclitaxel in hybrid lipid-polymer membranes", Analyst, vol. 143, no. 16, (20180000), pages 3808 - 3813, URL: https://doi.org/10.1039/c8an00838h
    - YANG, H. U.; RASCHKE, M. B., Optical gradient force nano-imaging and - spectroscopy, 1-5, (20150000), URL: http://arxiv.org/abs/1508.06358
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