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Extract from the Register of European Patents

EP About this file: EP3764429

EP3764429 - ANALYSIS METHOD FOR CRACK RATE OF ELECTRODE ACTIVE MATERIAL OF ELECTRODE FOR LITHIUM SECONDARY BATTERY [Right-click to bookmark this link]
StatusExamination is in progress
Status updated on  06.01.2023
Database last updated on 24.04.2024
FormerRequest for examination was made
Status updated on  07.05.2021
FormerThe application has been published
Status updated on  11.12.2020
Most recent event   Tooltip25.07.2023New entry: Renewal fee paid 
Applicant(s)For all designated states
LG Energy Solution, Ltd.
Tower 1, 108, Yeoui-daero
Yeongdeungpo-gu
Seoul 07335 / KR
[2022/13]
Former [2022/03]For all designated states
LG Energy Solution Ltd.
Tower 1, 108 Yeoui-daero
Yeongdeungpo-gu
07335 Seoul / KR
Former [2021/02]For all designated states
LG CHEM, LTD.
128, Yeoui-daero
Yeongdeungpo-gu
Seoul 07336 / KR
Inventor(s)01 / HAN, Jung Hoon
LG Chem Research Park, 188, Munji-ro, Yuseong-gu
34122 Daejeon / KR
02 / BAEK, Joo Yul
LG Chem Research Park, 188, Munji-ro, Yuseong-gu
34122 Daejeon / KR
 [2021/02]
Representative(s)Goddar, Heinz J.
Boehmert & Boehmert
Anwaltspartnerschaft mbB
Pettenkoferstrasse 22
80336 München / DE
[2021/02]
Application number, filing date20183872.903.07.2020
[2021/02]
Priority number, dateKR2019008312910.07.2019         Original published format: KR 20190083129
[2021/02]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP3764429
Date:13.01.2021
Language:EN
[2021/02]
Search report(s)(Supplementary) European search report - dispatched on:EP09.11.2020
ClassificationIPC:H01M4/02, G01N1/30, G01N23/2202, G01N23/2252, H01M4/13, H01M4/62
[2021/02]
CPC:
H01M4/621 (EP); G01N23/2251 (KR); G06T7/0004 (US);
G01N1/04 (KR); G01N1/44 (US); G01N23/2202 (EP);
H01M10/052 (KR); H01M4/02 (EP); H01M4/0416 (US);
H01M4/0447 (KR); H01M4/13 (EP); H01M4/139 (KR);
G06T2207/10061 (US); Y02E60/10 (EP) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2021/23]
Former [2021/02]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
Extension statesBANot yet paid
MENot yet paid
Validation statesKHNot yet paid
MANot yet paid
MDNot yet paid
TNNot yet paid
TitleGerman:ANALYSEVERFAHREN FÜR DIE RISSRATE EINES ELEKTRODENAKTIVMATERIALS EINER ELEKTRODE FÜR EINE LITHIUMSEKUNDÄRBATTERIE[2021/02]
English:ANALYSIS METHOD FOR CRACK RATE OF ELECTRODE ACTIVE MATERIAL OF ELECTRODE FOR LITHIUM SECONDARY BATTERY[2021/02]
French:PROCÉDÉ D'ANALYSE DU TAUX DE FISSURES DE MATÉRIAU ACTIF D'ÉLECTRODE POUR BATTERIE SECONDAIRE AU LITHIUM[2021/02]
Examination procedure29.04.2021Amendment by applicant (claims and/or description)
29.04.2021Examination requested  [2021/23]
29.04.2021Date on which the examining division has become responsible
09.01.2023Despatch of a communication from the examining division (Time limit: M04)
09.05.2023Reply to a communication from the examining division
Fees paidRenewal fee
25.07.2022Renewal fee patent year 03
25.07.2023Renewal fee patent year 04
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Documents cited:Search[Y]KR20170006663  (LG CHEMICAL LTD [KR]) [Y] 1-6 * figures, [0025] *;
 [Y]KR20180005060  (LG CHEMICAL LTD [KR]) [Y] 1-6 * figures, [0013]ff *;
 [Y]WO2018221929  (LG CHEMICAL LTD [KR]) [Y] 1-6 * figures, [0031]ff *;
 [T]  - "Why Magnification is Irrelevant in Modern Scanning Electron Microscopes Application Note Introduction", (20110705), URL: http://www.toyo.co.jp/files/user/img/product/microscopy/pdf/5990-8594EN.pdf, (20151021), XP055222489 [T] * the whole document *
 [T]  - EXNER, Messen und Ausgabe, EINFÜHRUNG IN DIE QUANTITATIVE GEFÜGEANALYSE, DEUTSCHE GESELLSCHAFT FÜR METALLKUNDE, PAGE(S) 75 - 76, (19860101), ISBN 978-3-88355-108-1, XP009186786 [T] * the whole document *
 [T]  - N.N., "SamplePreparationTechniquesforMicroscopic AnalysisinMetallurgy Sample Preparation Techniques for Microscopic Analysis in Metallurgy", (20140307), URL: https://www.azom.com/article.aspx?ArticleID=10711, (20201029), XP055745014 [T] * the whole document *
 [T]  - N.N., "GrainSizeAnalysis-Electron Backscatter Diffraction, Channelling ContrastImaging and OtherTechniques", (20021011), URL: https://www.azom.com/article.aspx?ArticleID=1694, (20201029), XP055745022 [T] * the whole document *
by applicant   - Journal of the Electrochemical Society, vol. 158, page 6
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