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EP0304632
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EP About this file: EP0304632
| EP0304632 - A contacless technique for semiconductor wafer testing [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 10.10.1997 Database last updated on 17.05.2024 | Most recent event Tooltip | 10.10.1997 | Application deemed to be withdrawn | published on 26.11.1997 [1997/48] | Applicant(s) | For all designated states International Business Machines Corporation New Orchard Road Armonk, NY 10504 / US | [N/P] |
| Former [1989/09] | For all designated states International Business Machines Corporation Old Orchard Road Armonk, N.Y. 10504 / US | Inventor(s) | 01 /
Curtis, Huntington Woodman Box 18 Chelsea New York 12512 / US | 02 /
Fung, Min-Su Route No. 1, Barmore Road LaGrangeville, N.Y. 12540 / US | 03 /
Verkuil, Roger Leonard 37, sherwood Heights Wappingers Falls, N.Y. 12590 / US | [1989/09] | Representative(s) | Schuffenecker, Thierry, et al Compagnie IBM France Département de Propriété Intellectuelle 06610 La Gaude / FR | [N/P] |
| Former [1996/20] | Schuffenecker, Thierry, et al Compagnie IBM France, Département de Propriété Intellectuelle F-06610 La Gaude / FR | ||
| Former [1989/09] | Bonin, Jean-Jacques Compagnie IBM France Département de Propriété Intellectuelle F-06610 La Gaude / FR | Application number, filing date | 88111849.1 | 22.07.1988 | [1989/09] | Priority number, date | US19870089648 | 26.08.1987 Original published format: US 89648 | [1989/09] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP0304632 | Date: | 01.03.1989 | Language: | EN | [1989/09] | Type: | A3 Search report | No.: | EP0304632 | Date: | 27.03.1991 | Language: | EN | [1991/13] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 04.02.1991 | Classification | IPC: | G01R31/302, G01R31/26, G01R5/28, H01L21/66 | [1991/09] | CPC: |
G01R31/2831 (EP,US);
G01R15/165 (EP,US)
|
| Former IPC [1989/09] | G01R31/26, H01L21/66 | Designated contracting states | DE, FR, GB [1989/09] | Title | German: | Kontaktlose Technik zum Prüfen von Halbleiter-Scheiben | [1989/09] | English: | A contacless technique for semiconductor wafer testing | [1989/09] | French: | Technique sans contact pour l'essai d'une tranche semi-conducteur | [1989/09] | Examination procedure | 19.06.1989 | Examination requested [1989/33] | 09.10.1992 | Despatch of a communication from the examining division (Time limit: M06) | 16.04.1993 | Reply to a communication from the examining division | 02.06.1993 | Despatch of a communication from the examining division (Time limit: M06) | 07.04.1994 | Reply to a communication from the examining division | 23.09.1994 | Despatch of a communication from the examining division (Time limit: M06) | 03.04.1995 | Reply to a communication from the examining division | 13.12.1995 | Despatch of communication of intention to grant (Approval: Yes) | 04.04.1996 | Communication of intention to grant the patent | 23.04.1996 | Fee for grant paid | 23.04.1996 | Fee for publishing/printing paid | 02.01.1997 | Application deemed to be withdrawn, date of legal effect [1997/48] | 28.02.1997 | Despatch of communication that the application is deemed to be withdrawn, reason: renewal fee not paid in time [1997/48] | Request for further processing for: | 07.04.1994 | Request for further processing filed | 07.04.1994 | Full payment received (date of receipt of payment) Request granted | 14.06.1994 | Decision despatched | Request for re-establishment of rights: | 07.04.1994 | Date of receipt | 14.06.1994 | Request accepted | Fees paid | Renewal fee | 23.07.1990 | Renewal fee patent year 03 | 13.12.1990 | Renewal fee patent year 04 | 25.07.1992 | Renewal fee patent year 05 | 16.07.1993 | Renewal fee patent year 06 | 18.07.1994 | Renewal fee patent year 07 | 14.07.1995 | Renewal fee patent year 08 | Penalty fee | Additional fee for renewal fee | 31.07.1996 | 09 M06 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [Y]US4326165 (SZEDON JOHN R) | [Y] - RADIO FERNSEHEN ELEKTRONIK. vol. 32, no. 2, February 1983, BERLIN DD pages 105 - 109; H.Eisenblätter et.al.: "Messungen des Oberflächenpotentials an hochohmigen Halbleitern und Dielektrika" |