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Extract from the Register of European Patents

EP About this file: EP0550432

EP0550432 - Electrical connector structure and method for obtaining an electrical interconnection assembly [Right-click to bookmark this link]
Former [1993/28]IMPROVED INTERCONNECTION STRUCTURE AND TEST METHOD
[1996/01]
StatusNo opposition filed within time limit
Status updated on  08.11.1996
Database last updated on 24.04.2024
Most recent event   Tooltip08.11.1996No opposition filed within time limitpublished on 27.12.1996 [1996/52]
Applicant(s)For all designated states
International Business Machines Corporation
New Orchard Road
Armonk, NY 10504 / US
[N/P]
Former [1993/28]For all designated states
International Business Machines Corporation
Old Orchard Road
Armonk, N.Y. 10504 / US
Inventor(s)01 / BEHUN, John, R.
56 Brooklands Farm Road
Poughkeepsie, NY 12601-5821 / US
02 / CALL, Anson, J.
376 Grape Hollow Road
Holmes, NY 12531 / US
03 / CAPPO, Frances, F.
23 DeGiarmo Hill Road
Wappingers Falls, NY 12590 / US
04 / COLE, Marie, S.
3 Rose Lane
Wappingers Falls, NY 12590 / US
05 / HOEBENER, Karl, G.
401 Innwood Drive
Georgetown, TX 78628 / US
06 / KLINGEL, Bruno, T.
12 Woodcrest Drive
Hopewell Junction, NY 12533 / US
07 / MILLIKEN, John, C.
P.O. Box 200
Patterson, NY 12563 / US
[1993/52]
Former [1993/28]01 / BEHUN, John, R.
56 Brooklands Farm Road
Poughkeepsie, NY 12601-5821 / US
02 / CALL, Anson, J.
1106 Hudson Harbour Drive
Poughkeepsie, NY 12601 / US
03 / CAPPO, Frances, F.
23 DeGiarmo Hill Road
Wappingers Falls, NY 12590 / US
04 / COLE, Marie, S.
3 Rose Lane
Wappingers Falls, NY 12590 / US
05 / HOEBENER, Karl, G.
401 Innwood Drive
Georgetown, TX 78628 / US
06 / KLINGEL, Bruno, T.
12 Woodcrest Drive
Hopewell Junction, NY 12533 / US
07 / MILLIKEN, John, C.
P.O. Box 200
Patterson, NY 12563 / US
Representative(s)de Pena, Alain
Compagnie IBM France Département de la Propriété Intellectuelle
06610 La Gaude / FR
[N/P]
Former [1994/40]de Pena, Alain
Compagnie IBM France Département de Propriété Intellectuelle
F-06610 La Gaude / FR
Former [1994/20]de Pena, Alain
Compagnie IBM France Départ. Propriété Intellectuelle
F-06610 La Gaude / FR
Former [1993/28]Schuffenecker, Thierry
Compagnie IBM France, Département de Propriété Intellectuelle
F-06610 La Gaude / FR
Application number, filing date90915908.917.10.1990
[1993/28]
WO1990US05962
Priority number, dateUS1990055512018.07.1990         Original published format: US 555120
[1993/28]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO9202039
Date:06.02.1992
Language:EN
[1992/04]
Type: A1 Application with search report 
No.:EP0550432
Date:14.07.1993
Language:EN
The application published by WIPO in one of the EPO official languages on 06.02.1992 takes the place of the publication of the European patent application.
[1993/28]
Type: B1 Patent specification 
No.:EP0550432
Date:03.01.1996
Language:EN
[1996/01]
Search report(s)International search report - published on:EP06.02.1992
ClassificationIPC:H01L21/98, H01L21/60, H01L23/538
[1993/28]
CPC:
H01L25/50 (EP,US); G01R31/2886 (EP,US); G01R31/66 (EP,US);
H01L21/563 (EP,US); H05K3/3436 (EP,US); H01L2224/73203 (EP,US);
H01L2224/81191 (EP,US); H01L2224/814 (EP,US); H01L2924/01078 (EP,US);
H01L2924/01322 (EP,US); H01L2924/09701 (EP,US); H05K2201/10234 (EP,US);
H05K2201/10977 (EP,US); H05K2201/10992 (EP,US); H05K2203/041 (EP,US);
Y02P70/50 (EP,US) (-)
C-Set:
H01L2224/814, H01L2924/014 (EP,US)
Designated contracting statesDE,   FR,   GB [1993/28]
TitleGerman:Elektrische Verbinderstruktur und Verfahren, einen elektrischen Verbindungsaufbau zu erhalten[1996/01]
English:Electrical connector structure and method for obtaining an electrical interconnection assembly[1996/01]
French:Structure de connecteur electrique et procédé pour obtenir un assemblage d'interconnexion electrique[1996/01]
Former [1993/28]VERBESSERTE VERBINDUNGSSTRUKTUR UND TESTVERFAHREN
Former [1993/28]IMPROVED INTERCONNECTION STRUCTURE AND TEST METHOD
Former [1993/28]STRUCTURE D'INTERCONNEXION AMELIOREE ET PROCEDE DE VERIFICATION
Entry into regional phase12.01.1993National basic fee paid 
12.01.1993Designation fee(s) paid 
12.01.1993Examination fee paid 
Examination procedure13.02.1992Request for preliminary examination filed
International Preliminary Examining Authority: DE
12.01.1993Examination requested  [1993/30]
17.12.1993Despatch of a communication from the examining division (Time limit: M06)
17.06.1994Reply to a communication from the examining division
30.01.1995Despatch of communication of intention to grant (Approval: Yes)
24.05.1995Communication of intention to grant the patent
19.06.1995Fee for grant paid
19.06.1995Fee for publishing/printing paid
Opposition(s)05.10.1996No opposition filed within time limit [1996/52]
Fees paidRenewal fee
22.10.1992Renewal fee patent year 03
21.10.1993Renewal fee patent year 04
21.10.1994Renewal fee patent year 05
24.10.1995Renewal fee patent year 06
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Cited inInternational searchWO9007792  [ ] (MOTOROLA INC [US]);
 EP0348972  [ ] (SHARP KK [JP]);
 EP0191434  [ ] (IBM [US])
 [A]  - IBM Technical Disclosure Bulletin, vol. 32, no. 10B, March 1990, (New York, US), "Encapsulated solder joint for chip mounting", page 480
 [A]  - IBM Technical Disclosure Bulletin, vol. 22, no. 4, September 1979, (New York, US), J.A. Brody et al.: "Storage and logic errors in dynamic memory devices due to innate radioactive materials in packaging and wafer", pages 1460-1461
 [A]  - Solid-State Technology, vol. 22, no. 1, January 1979, (Washington, US), J. Marshall et al.: "Solder bump interconnected, multiple chip, thick film hybrid for 40-character alpha-numeric LCD application", pages 87-93
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.