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Extract from the Register of European Patents

EP About this file: EP0729179

EP0729179 - Pressure contact housing for semiconductor component [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  05.05.2001
Database last updated on 11.05.2024
Most recent event   Tooltip22.05.2009Change - representativepublished on 24.06.2009  [2009/26]
Applicant(s)For all designated states
ABB Industrie AG
Haselstrasse 16
5400 Baden / CH
[2000/27]
Former [2000/23]For all designated states
Asea Brown Boveri AG
Haselstrasse 16
5401 Baden / CH
Former [1997/06]For all designated states
ASEA BROWN BOVERI AG
Haselstrasse 16
5401 Baden / CH
Former [1996/35]For all designated states
ABB Management AG
Haselstrasse 16
CH-5401 Baden / CH
Inventor(s)01 / Bolgiani, Fabio
Via ai Ronchi 9
CH-6500 Bellinzona / CH
[1996/35]
Representative(s)ABB Patent Attorneys
C/o ABB Schweiz AG
Intellectual Property CH-IP
Brown Boveri Strasse 6
5400 Baden / CH
[N/P]
Former [2009/26]ABB Patent Attorneys
C/o ABB Schweiz AG Intellectual Property (CH-LC/IP), Brown Boveri Strasse 6
5400 Baden / CH
Former [2000/27]ABB Patent Attorneys
c/o ABB Business Services Ltd. (SLE-I) Haselstrasse 16/699
5401 Baden / CH
Application number, filing date96810070.102.02.1996
[1996/35]
Priority number, dateDE1995100538717.02.1995         Original published format: DE 19505387
[1996/35]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP0729179
Date:28.08.1996
Language:DE
[1996/35]
Type: B1 Patent specification 
No.:EP0729179
Date:05.07.2000
Language:DE
[2000/27]
Search report(s)(Supplementary) European search report - dispatched on:EP22.05.1996
ClassificationIPC:H01L23/051
[1996/35]
CPC:
H01L24/72 (EP,US); H01L23/051 (EP,KR,US); H01L2924/01004 (EP,US);
H01L2924/01005 (EP,US); H01L2924/01013 (EP,US); H01L2924/01033 (EP,US);
H01L2924/01042 (EP,US); H01L2924/01068 (EP,US); H01L2924/01082 (EP,US);
H01L2924/30107 (EP,US) (-)
Designated contracting statesDE,   FR,   GB,   IT,   NL [1996/35]
TitleGerman:Druckkontaktgehäuse für Halbleiterbauelemente[1996/35]
English:Pressure contact housing for semiconductor component[1996/35]
French:Boîtier de contact par pression pour composant semi-conducteur[1996/35]
Examination procedure13.02.1997Examination requested  [1997/15]
09.04.1998Despatch of a communication from the examining division (Time limit: M04)
05.08.1998Reply to a communication from the examining division
14.04.1999Despatch of a communication from the examining division (Time limit: M02)
09.06.1999Reply to a communication from the examining division
28.07.1999Despatch of communication of intention to grant (Approval: Yes)
18.08.1999Communication of intention to grant the patent
16.10.1999Fee for grant paid
16.10.1999Fee for publishing/printing paid
Opposition(s)06.04.2001No opposition filed within time limit [2001/25]
Fees paidRenewal fee
21.02.1998Renewal fee patent year 03
19.01.1999Renewal fee patent year 04
14.01.2000Renewal fee patent year 05
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Documents cited:Search[A]US4092703  (SUEOKA TETSURO, et al) [A] 1 * figures 16,17; claim 1 *;
 [A]EP0159797  (MITSUBISHI ELECTRIC CORP [JP]) [A] 1 * figures 7,8 *;
 [A]CH582425  (WESTINGHOUSE ELECTRIC CORP) [A] 1 * figures 1,2 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.